Results 221 to 230 of about 19,073 (304)

Kelvin Probe Force Microscopy Imaging of Plasticity in Hydrogenated Perovskite Nickelate Multilevel Neuromorphic Devices. [PDF]

ACS Nano
Dey T, Lai X, Manna S, Patel K, Patel RK, Bisht RS, Zhou Y, Shah S, Andrei EY, Sankaranarayanan SKRS, Kuzum D, Schuman C, Ramanathan S.   +12 more
europepmc   +1 more source

Stabilizing the Anode and Cathode Interface Synchronously via Electrolyte-Triggered Hydrogel Interphase for Zinc Metal Batteries. [PDF]

Nanomicro Lett
Cai X, Li X, Liang J, Qiu J, Lin W, Dai C, Lin Z, Zhao J.   +7 more
europepmc   +1 more source

Negative Out-of-Plane Electromechanical Response in Nonpiezoelectric van der Waals Layered Materials Encapsulated by Monolayer Boron Nitride. [PDF]

J Phys Chem Lett
Liu Q, Choyal VK, Hu H, Rabczuk T, Jiang X, Zhuang X.   +5 more
europepmc   +1 more source

Rapid 3D printing of hierarchical nanoporous copper structures with self-disintegration capability. [PDF]

Nat Commun
Liu L, K Crawford N, Wang W, Niauzorau S, Zhu Y, Carvalho de Castro Sene F, Wang Y, Liu S, Thotta Jayachandran A, Azeredo B, Chen X.   +10 more
europepmc   +1 more source

Highly oriented semiconducting polymer nanofilm with enhanced crystallinity. [PDF]

Nat Commun
Xie W, Deng Q, Wu J, Li F, Dan W, Wang X, Han L, Gu H.   +7 more
europepmc   +1 more source

Reviving Nitrogen-Vacancy Centers in Diamond via Local Surface Modification. [PDF]

Nano Lett
Trofimov S, Aytac M, Mendoza Delgado M, Pregnolato T, Ahiboz D, Makarova A, Krivenkov M, Rader O, Schröder T, Popov C, Naydenov B.   +10 more
europepmc   +1 more source

Exploration of Quasi-Direct Band Edge in a Multilayer Ferroelectric Semiconductor for Applications in Van Der Waals Stacked Heterojunction Solar Cell and Photocatalytic Devices. [PDF]

Adv Sci (Weinh)
Ummah AM, Su YC, Peng YH, Xu YX, Ho CH.
europepmc   +1 more source

A study of TaN film field electron emitter material by a Kelvin probe force microscope

A study of TaN film field electron emitter material by a Kelvin probe force microscope
openaire  

Kelvin Probe Force Microscope

, 2018
KPFM mode as shown in Fig. 51.1 generates images based on the electric potential of the sample surface. Applying an AC voltage to a conductive cantilever and detecting the resulting electric force makes it possible to observe the surface profile and, at the same time, the surface potential distribution.
Risa Fuji
openaire   +2 more sources

Surface photovoltage spectroscopy in a Kelvin probe force microscope under ultrahigh vacuum

Review of Scientific Instruments, 2009
Surface photovoltage (SPV) spectroscopy is a common method for optoelectronic semiconductor characterization. Kelvin probe force microscopy has developed into a widely used tool for nanoscale characterization of semiconductors, metals, and insulators.
F, Streicher, S, Sadewasser, M Ch, Lux-Steiner   +2 more
openaire   +3 more sources