Results 231 to 240 of about 19,073 (304)
Procedure for Calibrating Kelvin Probe Force Microscope
, 2011 The paper presents novel method for calibrating Kelvin Probe Force Microscope. The method is based on measuring the surface potential of a reference sample and comparing it with the results obtained by KFM. Proposed method offers a calibration possibility in the whole measuring range of the microscope both in terms of absolute values and dynamic ...
M. Ligowski +2 more
openaire +2 more sources
Direct Piezoelectric Potential Measurement of ZnO Nanowires Using a Kelvin Probe Force Microscope
Chinese Physics Letters, 2013 Precise measurements of the piezoelectric signals are essential for tailoring the properties of ZnO nanowire (NW) based energy conversion devices. We characterize three-dimensional piezoelectric potential profiles of NW arrays using a kelvin probe force microscope (KPFM).
Xian-Ying Wang +3 more
openaire +2 more sources
Kelvin Probe Force Microscope Observation of Donors’ Arrangement in Si Transistor Channel
Advanced Materials Research, 2015 Further development of dopant-atom-based transistors requires investigation of the effects of discrete dopant distribution on device operation. Hence, it is important to monitor dopants’ arrangement inside transistor channels. We used Kelvin Probe Force Microscope (KPFM) to measure surface potential profiles of field-effect transistor (FET) channels ...
Krzysztof Tyszka +4 more
openaire +2 more sources
Surface investigations with a Kelvin probe force microscope
Ultramicroscopy, 1992 Abstract The contact potential difference between a reference tip and sample can be measured with high spatial resolution using a modified version of the scanning force microscope. The instrument is comparable to a Kelvin probe but allows the simultaneous imaging of contact potential difference and, in addition, topography.
M. Nonnenmacher +2 more
openaire +2 more sources
Measuring minority-carrier diffusion length using a Kelvin probe force microscope
Physical Review B, 2000 A method based on Kelvin probe force microscopy for measuring minority-carrier diffusion length in semiconductors is described. The method is based on measuring the surface photovoltage between the tip of an atomic force microscope and the surface of an illuminated semiconductor junction.
R. Shikler +3 more
openaire +2 more sources
Kelvin probe force microscope with near-field photoexcitation
Journal of Applied Physics, 2010 We developed a combined probe microscope—a scanning probe near-field optical microscope (SNOM) combined with Kelvin probe force microscope (KFM) that uses a slim and bent optical fiber probe (S/B fiber probe). The developed SNOM-KFM system enables near-field photoexcitation through an apex of the S/B fiber probe during KFM measurement, so that the ...
K. Ozasa, S. Nemoto, M. Maeda, M. Hara
openaire +2 more sources
Improvement of Kelvin Probe Force Microscope (KFM) System
Japanese Journal of Applied Physics, 1995 The Kelvin probe force microscope (KFM) is a useful tool that measures the surface potentials of both conducting and nonconducting materials. Recently, we have succeeded in improving the accuracy of potential measurements and increased the lateral resolution of the topographic image. Furthermore, Z axis servo control was improved to prevent the
Masatoshi Yasutake
openaire +2 more sources
Applied Physics A, 2019 In this paper, MoS2/PbI2 heterostructures were synthesized via a two-step synthesis method using vapor deposition and direct water bath heating. Raman spectroscopy and Atomic Force Microscope were used to characterize the MoS2/PbI2 heterostructures. The Kelvin probe force microscope was characterized the surface potential of MoS2/PbI2 heterostructures.
Simin Ding +6 more
openaire +2 more sources
Writing polarization bits on the multiferroic BiMnO3 thin film using Kelvin probe force microscope
Applied Physics Letters, 2004 We report the multiferroic properties of epitaxially (100) oriented BiMnO3 thin film on (100) LaAlO3 substrate and preferentially (111) oriented BiMnO3 thin film on (111) Pt/TiO2/SiO2/Si substrate. Nano-size bits of ferroelectric polarization on the BiMnO3 thin film on (111) Pt/TiO2/SiO2/Si substrate can be easily written and read by Kelvin force ...
J. Y. Son +3 more
openaire +2 more sources
Reconstruction of dopant vertical position from Kelvin probe force microscope images
, 2015 In novel nano-scale electronic devices the number and location of individual dopant atoms within a device determine its characteristics. Therefore, precise control over these parameters is required. In this paper we describe Kelvin Probe Force Microscope (KPFM) designed for dopant detection.
Krzysztof Tyszka, Ryszard Jabłoński
openaire +2 more sources