Results 251 to 260 of about 19,073 (304)

Surface potential measurements using the Kelvin probe force microscope

Thin Solid Films, 1996
Abstract The Kelvin probe force microscope (KFM) can measure both the surface potential and the topographic image simultaneously without contacting the sample surface. Furthermore, both conducting and non-conducting thin layers can be measured directly with a millivolt range potential resolution and a sub-micrometer lateral resolution. In this paper,
Masatoshi Yasutake, Daisuke Aoki, Masamichi Fujihira   +2 more
openaire   +1 more source

Characterization of locally modified diamond surface using Kelvin probe force microscope

Surface Science, 2005
Abstract The surface potential difference between an H-terminated surface and a locally oxidized diamond surface produced by an atomic force microprobe was investigated using a Kelvin probe force microscope. The potential of the H-terminated diamond surface was observed to be ∼0.1 V higher than that of the oxidized diamond surface.
Minoru Tachiki, Yu Kaibara, Yu Sumikawa, Masatsugu Shigeno, Hirohumi Kanazawa, Tokishige Banno, Kwang Soup Song, Hitoshi Umezawa, Hiroshi Kawarada   +8 more
openaire   +1 more source

Examining the uniformity of the superhydrophobic coating on steel substrates using Kelvin probe force microscope

Progress in Organic Coatings, 2021
Abstract In the present work, the influence of superhydrophobic (SHP) silane as well as silanized silica nanoparticle coating on various steel substrates such as modified 9Cr-1Mo and 304L, were examined using Kelvin probe force microscopy (KPFM) for the first time.
K. Indira, M. Ezhil Vizhi, Brindhadevi Kathirvel, Arivalagan Pugazhendhi   +3 more
openaire   +1 more source

Metal-to-Oxide Charge Transfer Observed by a Kelvin Probe Force Microscope

Catalysis Surveys from Asia, 2009
The charge transfer from a nanometer-sized transition metal particle to a catalyst support is thought to affect reactions over the metal surface. We propose the application of Kelvin probe force microscope, which is an extension of the atomic force microscope, to observe the charge transfer particle-by-particle.
Akira Sasahara, Kumiko Hiehata, Hiroshi Onishi   +2 more
openaire   +1 more source

Kelvin probe force microscopic study of anodically and cathodically doped poly-3-methylthiophene

Synthetic Metals, 2000
The doping-level distribution and surface morphology of thin films of p- and n-doped poly-3-methylthiophene (P3MT) deposited onto highly oriented pyrolytic graphite (HOPG) were characterized on a microscopic scale by using Kelvin probe force microscopy (KFM) and in situ atomic force microscopy (ECAFM) techniques.
O.A. Semenikhin, L. Jiang, K. Hashimoto, A. Fujishima   +3 more
openaire   +1 more source

Microscopic investigation of InGaN/GaN heterostructure laser diode degradation using Kelvin probe force microscopy

Journal of Physics D: Applied Physics, 2008
We report on Kelvin probe force microscopy (KPFM) measurements on fresh and artificially aged InGaN/GaN laser test structures. In the case of an unbiased laser diode, a comparison of the surface potential between a fresh and a stressed laser diode shows a pronounced modification of the laser facet due to the aging process.
A Lochthofen, W Mertin, G Bacher, M Furitsch, G Brüderl, U Strauss, V Härle   +6 more
openaire   +1 more source

A Kelvin probe force microscopic study of the local dopant distribution in conducting polybithiophene

Electrochimica Acta, 1997
Local dopant distribution in electrochemically deposited polybithiophene films as well as the effect of the electrochemical treatment were studied ex situ using the technique of Kelvin probe force microscopy (KFM). The doping-level distribution was found to be directly related to the polymer surface morphology.
O.A. Semenikhin, L. Jiang, T. Iyoda, K. Hashimoto, A. Fujishima   +4 more
openaire   +1 more source

Investigation of the secondary phases of Alloy 617 by Scanning Kelvin Probe Force Microscope

Materials Letters, 2008
Abstract Alloy 617 (nickel based austenitic alloy) is a candidate structural material for next generation high temperature nuclear reactor. The secondary phases present in the Alloy 617 has been identified as TiN and M 23 C 6 by optical microscopy, scanning electron microscopy (SEM) and energy dispersive X-ray analysis (EDAX).
S. Rahman, G. Priyadarshan, K.S. Raja, C. Nesbitt, M. Misra   +4 more
openaire   +1 more source

Probing the Stability of Superhydrophobic (SHP) Silane Coating on Anodized Ti Substrate Using Kelvin Probe Force Microscope (KPFM)

Transactions of the Indian Institute of Metals, 2019
The present work aims at probing the stability of superhydrophobic (SHP) silane coating on anodized Ti substrate in different environmental conditions using Kelvin probe force microscope (KPFM) technique. The measurements were carried out for anodized silane-coated SHP Ti samples before and after exposure to UV light and flowing water systems. The KPFM
K. Indira, S. C. Vanithakumari, U. Kamachi Mudali, C. Mallika   +3 more
openaire   +1 more source

A study of TaN film field electron emitter material by a Kelvin probe force microscope

Microelectronic Engineering, 2004
Kelvin probe force microscope (KPFM), which is an application of the non-contact atomic force microscope, allows us to observe the images of the microscopic contact potential difference (CPD) between tip and sample and the surface topographic image, simultaneously.
Miya, K, Sasaki, M, Yamamoto, S, Gotoh, Y, Kawamura, Y, Ishikawa, J   +5 more
openaire   +1 more source