Results 261 to 270 of about 19,073 (304)

Development of an improved Kelvin probe force microscope for accurate local potential measurements on biased electronic devices

Journal of Microscopy, 2017
SummaryAn improved setup for accurate near‐field surface potential measurements and characterisation of biased electronic devices using the Kelvin Probe method has been developed. Using an external voltage source synchronised with the raster‐scan of the KPFM‐AM, this setup allows to avoid potential measurement errors of the conventional Kelvin Probe ...
N B, Bercu, L, Giraudet, O, Simonetti, M, Molinari   +3 more
openaire   +2 more sources

Grain dependence of ferroelectric domain switching on SrBi2Ta2O9 thin films observed by Kelvin probe force microscope

Thin Solid Films, 2006
We have studied grain-shape dependence of Kelvin probe force microscopy of SrBi2Ta2O9 thin films on epitaxial La0.5Sr0.5CoO3/LaAlO3 substrates. By changing the growth condition in pulsed laser deposition, we have grown the SrBi2Ta2O9 thin films with various grain shapes.
J.Y. Son, Bog G. Kim, J.H. Cho
openaire   +1 more source

Secondary electron doping contrast: Theory based on scanning electron microscope and Kelvin probe force microscopy measurements

Journal of Applied Physics, 2010
The secondary electron emission flux in a scanning electron microscope is a powerful tool for delineation of electrically active dopant concentration, built-in potentials, and surface electric fields in semiconductor junctions. In all the secondary electron images of p-n junctions, the p-doped regions appear brighter than n-doped regions.
I. Volotsenko, M. Molotskii, Z. Barkay, J. Marczewski, P. Grabiec, B. Jaroszewicz, G. Meshulam, E. Grunbaum, Y. Rosenwaks   +8 more
openaire   +1 more source

Imaging of an Electret Film Fabricated on a Micro-Machined Energy Harvester by a Kelvin Probe Force Microscope

, 2022
Kenta Nakazawa, Kengo Fukazawa, Takeshi Uruma, Gen Hashiguchi, Futoshi Iwata   +4 more
openalex   +1 more source

Kelvin probe force microscopic investigation of graphene-based derivatives

Japanese Journal of Applied Physics, 2020
K. Kanishka H. De Silva, Shuhei Ogawa, Pamarti Viswanath, Masamichi Yoshimura   +3 more
openaire   +1 more source

Direct Correlation between Local Surface Potential Measured by Kelvin Probe Force Microscope and Electrochemical Potential of LiNi_0.80Co_0.15Al_0.05O₂ Cathode at Different State of Charge

, 2018
Xinhua Zhu, Reynier I. Revilla, Annick Hubin   +2 more
openalex   +1 more source

Direct Observation of zirconium nitride hot carriers by Kelvin Probe Force Microscope

, 2021
Satoshi Ishii, Min‐Wen Yu, Shinde Satish, Tanjaya Kevin, Kuo‐Ping Chen, Tadaaki Nagao   +5 more
openalex  

Local work function analysis of Pt/TiO₂photocatalyst by a Kelvin probe force microscope

, 2007
Kumiko Hiehata, Akira Sasahara, Hiroshi Ōnishi   +2 more
openalex   +1 more source

Machine Learning Force Fields

Chemical Reviews, 2021
Oliver T Unke, Stefan Chmiela, Huziel E Sauceda   +2 more
exaly  

Observation of Contact Potential Difference (CPD) on Semiconducter Surface using Ultrahigh Vacuum Scanning Kelvin Probe Force Microscope (UHV SKPM)

, 2001
Shinichi Kitamura, Katsuyuki Suzuki, Charles Mooney   +2 more
openalex   +1 more source