Results 21 to 30 of about 19,073 (304)
Beilstein Journal of Nanotechnology, 2015 Background: The resolution in electrostatic force microscopy (EFM), a descendant of atomic force microscopy (AFM), has reached nanometre dimensions, necessary to investigate integrated circuits in modern electronic devices.
Urs Gysin +6 more
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Beilstein Journal of Nanotechnology, 2022 In this paper, we derive and present quantitative expressions governing the performance of single and multifrequency Kelvin probe force microscopy (KPFM) techniques in both air and water.
Jason I. Kilpatrick +2 more
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Investigation of Kelvin probe force microscopy efficiency for the detection of hydrogen ingress by cathodic charging in an aluminium alloy [PDF]
, 2013 Detecting and locating absorbed hydrogen in aluminium alloys is necessary for evaluating the contribution of hydrogen embrittlement to the degradation of the mechanical properties for corroded or cathodically hydrogen-charged samples.
Alexis, Joël +5 more
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High-Bandwidth Multiparametric Kelvin Probe Force Microscopy With Polymer Microcantilevers
IEEE Access, 2019 Simultaneous and rapid measurement of the surface potential (SP) and nanomechanical properties (NMPs) of materials plays an important role in the study of, for example, piezoelectric materials and multi-component composites.
Hao Zhang +5 more
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Dopant-Based Charge Sensing Utilizing P-I-N Nanojunction
Metrology and Measurement Systems, 2017 We studied lateral silicon p-i-n junctions, doped with phosphorus and boron, regarding charge sensing feasibility. In order to examine the detection capabilities and underlying mechanism, we used in a complementary way two measurement techniques.
Nowak Roland, Jabłoński Ryszard
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Wide Bandgap Nanocoatings for Polymer Dielectric with Outstanding Electrical Strength
Advanced Materials Interfaces, 2022 As the core components of insulation systems or film capacitors, polymer dielectrics are widely used in electrical and electronic equipment and for energy storage. However, the electrical strength is always the bottleneck that limits further application.
Tian‐Yu Wang +9 more
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Crystals, 2020 Recently, gallium telluride (GaTe) has triggered much attention for its unique properties and offers excellent opportunities for nanoelectronics. Yet it is a challenge to bridge the semiconducting few-layered GaTe crystals with metallic electrodes for ...
Xiuxin Xia +3 more
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Noise performance of frequency modulation Kelvin force microscopy
Beilstein Journal of Nanotechnology, 2014 Noise performance of a phase-locked loop (PLL) based frequency modulation Kelvin force microscope (FM-KFM) is assessed. Noise propagation is modeled step by step throughout the setup using both exact closed loop noise gains and an approximation known as “
Heinrich Diesinger +2 more
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Combined Kelvin probe force microscopy and secondary ion mass spectrometry for hydrogen detection in corroded 2024 aluminium alloy [PDF]
, 2013 The capability of Kelvin probe force microscopy (KFM) to detect and locate hydrogen in corroded 2024 aluminium alloy was demonstrated. Hydrogen was introduced inside the 2024 alloy following a cyclic corrosion test consisting of cycles of immersion in 1 ...
Alexis, Joël +5 more
core +3 more sources