Results 151 to 160 of about 4,546,528 (308)

Stuffed MO layer as a diffusion barrier in metallizations for high temperature electronics [PDF]

open access: yes
Auger electron spectroscopy was employed to characterize the diffusion barrier properties of molybdenum in the CrSi2/Mo/Au metallization system. The barrier action of Mo was demonstrated to persist even after 2000 hours annealing time at 300 C in a ...
Boah, J. K., Russell, V., Smith, D. P.
core   +1 more source

Nano-scaled functional layers for current and heat transport in electronics packaging

open access: green, 2008
Matthias Heimann   +4 more
openalex   +2 more sources

Layer-by-Layer Assembly and UV Photoreduction of Graphene–Polyoxometalate Composite Films for Electronics [PDF]

open access: green, 2011
Haolong Li   +5 more
openalex   +1 more source

Home - About - Disclaimer - Privacy