Results 231 to 240 of about 518,024 (300)

Polarity-Dependent Charge Transport and Resistance Degradation Enabled by Oxygen-Vacancy Gradients in BiFeO₃ Films. [PDF]

ACS Appl Mater Interfaces
Aphayvong S, Verma A, Nakamura K, Habib Akhyari A, Yoshimura T, Trolier-McKinstry S, Akkopru-Akgun B.   +6 more
europepmc   +1 more source

Micro-Power Harvesting from Electromagnetic Interferences in Power Systems. [PDF]

Micromachines (Basel)
d'Ambrosio M, Marasca G, Calvo M, Romani A, Corsaro C, Patanè S.   +5 more
europepmc   +1 more source

Periodic Motion Characteristics of a Magnetic Suspended Dual-Rotor System with Nonlinear Bearing Effects. [PDF]

Sensors (Basel)
Liu M, Wang N, Chen X, Xu Y, Ding Y, Wang Q.   +5 more
europepmc   +1 more source

Development and analysis of a seven-level common- ground switched-capacitor inverter topology. [PDF]

Sci Rep
Sarwar A, Parween S, Zaid M, AlAqil MA, Alam MS, Ali M.   +5 more
europepmc   +1 more source

High-precision hyperdimensional computing enabled by in-memory computing using high-polarization ferroelectric Hf_0.5Zr_0.5O₂ capacitors. [PDF]

Microsyst Nanoeng
Paasio E, Thomann S, Anu A, Li X, Ranta R, Srivari P, Muhammad S, Mazumder S, Mariam J, Padovani A, Amrouch H, Thareja G, Majumdar S.   +12 more
europepmc   +1 more source

A Fully Integrated Monolithic Monitor for Aging-Induced Leakage Current Characterization. [PDF]

Sensors (Basel)
Darko EN, Karimpour S, Adjei D, Tamakloe K, Chen D.   +4 more
europepmc   +1 more source

Surface Leakage Current of Glass

The Journal of the Institute of Electrical Engineers of Japan, 1957
openaire   +1 more source

Statistical Leakage Estimation Based on Sequential Addition of Cell Leakage Currents

IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2010
This paper presents a novel method for full-chip statistical leakage estimation that considers the impact of process variation. The proposed method considers the correlations among leakage currents in a chip and the state dependence of the leakage current of a cell for an accurate analysis.
Young Hwan Kim
exaly   +5 more sources

Modeling drive currents and leakage currents: a dynamic approach

Journal of Computational Electronics, 2009
The dynamics of electrons and holes propagating through the nano-scaled channels of modern semiconductor devices can be seen as a widespread manifestation of non-equilibrium statistical physics and its ruling principles. In this respect both the devices that are pushing conventional CMOS technology towards the final frontiers of Moore’s law and the ...
Magnus, Wim, Brosens, Fons, Sorée, Bart
openaire   +3 more sources

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Current leakage in bipolar electrocoagulation

Neurosurgery, 1983
Bipolar electrocoagulation has previously been shown to give a considerable amount of current leakage to ground from either of the two outputs. This might result in unwanted tissue destruction. Thus far, no standard has been proposed for current leakage to ground from the outputs of bipolar equipment.
B, Vällfors, B E, Erlandson, H A, Hansson, B O, Wieck   +3 more
openaire   +2 more sources