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Polarization retention loss in PbTiO3 ferroelectric films due to leakage currents
Journal of Applied Physics, 2007Alessio Morelli +2 more
exaly
Origins of reverse bias leakage currents in hydrogenated amorphous silicon p‐i‐n detector structures
Applied Physics Letters, 1992exaly
LEAKAGE CURRENT DETECTION CIRCUIT AND LEAKAGE CURRENT PROTECTION CIRCUIT
WANG HAN +4 moreopenaire +2 more sources

