Results 281 to 290 of about 112,162 (295)
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A new physical model and experimental measurements of copper interconnect resistivity considering size effects and line-edge roughness (LER)

2009 IEEE International Interconnect Technology Conference, 2009
G. Lopez   +2 more
semanticscholar   +1 more source

The Transfer of Photoresist LER Through Etch

2006
Bruno la Fontaine   +2 more
exaly  

Ler Devagar

World Literature Today, 2017
openaire   +1 more source

Exklusive Gymnasien und ihre Schüler

2018
Katrin Kotzyba   +2 more
exaly  

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