Results 171 to 180 of about 33,419 (191)

Impact of Gate Line-Edge Roughness (LER) Versus Random Dopant Fluctuations (RDF) on Germanium-Source Tunnel FET Performance

IEEE transactions on nanotechnology, 2013
N. Damrongplasit, Sung Hwan Kim, C. Shin, T. Liu   +3 more
semanticscholar   +1 more source

Evaluation of methods for noise-free measurement of LER/LWR using synthesized CD-SEM images

Advanced Lithography, 2013
V. Constantoudis, E. Pargon
semanticscholar   +1 more source

Statistical variability in scaled generations of n-channel UTB-FD-SOI MOSFETs under the influence of RDF, LER, OTF and MGG

International SOI Conference, 2012
S. Markov, A. Zain, B. Cheng, A. Asenov
semanticscholar   +1 more source

Ulrike ler

World Literature Today, 1988
Steven P. Sondrup, Ulf Ericksson
openaire   +1 more source

The Per regulon of enteropathogenic Escherichia coli : identification of a regulatory cascade and a novel transcriptional activator, the locus of enterocyte effacement (LEE)‐encoded regulator (Ler)

Molecular Microbiology, 1999
Jay L. Mellies, Simon J. Elliott, V. Sperandio, M. Donnenberg, James B. Kaper   +4 more
semanticscholar   +1 more source

A Comprehensive LER-Aware TDDB Lifetime Model for Advanced Cu Interconnects

IEEE transactions on device and materials reliability, 2011
M. Stucchi, P. Roussel, Z. Tokei, S. Demuynck, G. Groeseneken   +4 more
semanticscholar   +1 more source

Understanding LER-Induced MOSFET $V_{T}$ Variability—Part I: Three-Dimensional Simulation of Large Statistical Samples

IEEE Transactions on Electron Devices, 2010
D. Reid, C. Millar, Scott Roy, A. Asenov
semanticscholar   +1 more source

Vestibüler Disfonksiyon

2023
exaly  

Uniqueness of the solution in a Kantorovich-type theorem of Häu\ler for the Gauss-Newton Method

Japan Journal of Industrial and Applied Mathematics, 1989
Yamamoto Tetsuro
exaly  

A new physical model and experimental measurements of copper interconnect resistivity considering size effects and line-edge roughness (LER)

2009 IEEE International Interconnect Technology Conference, 2009
G. Lopez, J. Davis, J. Meindl
semanticscholar   +1 more source