Results 211 to 220 of about 6,988 (254)
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Implementation of high-level operations

1993
In this chapter, we will investigate how a silage description is transformed into a register-transfer description.
Jan Vanhoof   +4 more
openaire   +1 more source

Provider-Level Factors Influencing Implementation

2018
Cancer treatment is increasingly complex. The tools for diagnosis, staging, and predicting prognosis are rapidly evolving, as are the therapies, treatment modalities, and treatment protocols. The complexity of care, the need for a multidisciplinary team across settings, and patient-level factors all present providers with a unique set of challenges ...
Alex H. Krist, Vivian Jiang
openaire   +1 more source

Implementing Language Support in High-Level Languages

IEEE Transactions on Software Engineering, 1984
Summary: One of the requirements for building an operating system in a high-level operating system language, such as Ada, concurrent Pascal, or modula, is the construction of a language support system, or kernel. This paper presents a model that generalizes the concept of a kernel, and defines a kernel and the processes it supports to be at different ...
McKendry, Martin S., Campbell, Roy H.
openaire   +2 more sources

Wafer Level Reliability Competitiveness And Implementation Issues

International Integrated Reliability Workshop Final Report, 1993
ABSTRACT How does wafer level reliability assessment and testing methodology integrate into the semiconductor manufacturers overall reliability assurance and improvement strategy? What wafer level tests are appropriate and when should they be utilized? Wafer level reliability has made the evolutionary step from academia to manufacturing actuality. This
Jeff S. May, Hoang H. Hoang
openaire   +1 more source

An ASIC level BIST implementation for system level testing

[1991] Proceedings Fourth Annual IEEE International ASIC Conference and Exhibit, 2002
The architecture and operation of a built-in self-test (BIST) implementation at the ASIC level for use at manufacturing unit level testing and system diagnostics is described. Analysis of this BIST approach is given in terms of area overhead, fault coverage, reduction in manufacturing testing costs, and reduction in system diagnostic execution time. >
C.E. Stroud, R.F. Shaw
openaire   +1 more source

Wafer Level Implementation

International Integrated Reliability Workshop Final Report, 1993
G. Claudius, R. Hijab
openaire   +1 more source

Levels of a Schema Implementations

1988
As CAD systems provide different levels of capabilities one cannot expect all systems to support the full schema in their pre- and post-processors. On the other hand, it must not be left to the choice of the implementer of processors which subset of entities and attribute he wants to support.
openaire   +1 more source

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