Results 261 to 270 of about 351,024 (329)

Current-modulating magnetic force microscope probe

Journal of Applied Physics, 2001
A new current-modulating probe for the magnetic force microscope (MFM) is proposed in this article. The magnetic field, which will be used to interact with a magnetic specimen’s stray field, is induced on the sharp tip of the conical magnetic core surrounded by a microfabricated single turn conductive coil.
Frank Z. Wang, Na Helian, Warwick W Clegg, James F. C. Windmill, David Jenkins   +4 more
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Cryogenic Magnetic Force Microscope

AIP Conference Proceedings, 2003
A magnetic force microscope has been constructed to image fluxlines in superconductors. In order to facilitate operation at low temperatures, cantilever deflections are detected with an interferometer which requires only an optical fibre in the cryostat. The design and modes of operation of the microscope are described.
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A high performance magnetic force microscope

Measurement Science and Technology, 1996
We have constructed a high performance magnetic force microscope optimized for operation in the force gradient detection mode. The instrument incorporates a novel differential heterodyne interferometer that has a high immunity to microphonics and interference.
M S Valera, A N Farley
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The Magnetic Resonance Force Microscope

1998
The magnetic resonance force microscope (MRFM) marries the techniques of magnetic resonance imaging (MRI) and atomic force microscopy (AFM), to produce a three-dimensional imaging instrument with high, potentially atomic-scale, resolution. The principle of the MRFM has been successfully demonstrated in numerous experiments.
P. C. Hammel, Z. Zhang, M. Midzor, M. L. Roukes, P. E. Wigen, J. R. Childress   +5 more
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Magnetic force microscope combined with a scanning electron microscope

Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 1993
A magnetic force microscope (MFM) using frequency modulation detection was combined with a scanning electron microscope (SEM). The first goal was to facilitate the selection of the MFM imaging field by positioning the magnetic tip using the SEM. The second goal was to improve the performance of the MFM by operating it in a vacuum. The efficiency of the
Atsushi Kikukawa, Sumio Hosaka, Yukio Honda, Hajime Koyanagi   +3 more
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Observation of magnetic forces by the atomic force microscope

Journal of Applied Physics, 1987
We present a new way to observe the surface domain distribution of a magnetic sample at a submicrometer scale. This magnetic microscopy is based on the idea of measuring magnetic forces with the recently developed atomic force microscope (AFM). We study the magnetic forces involved in the interaction between a single-domain microtip and the sample ...
J. J. Sáenz, N. García, P. Grütter, E. Meyer, H. Heinzelmann, R. Wiesendanger, L. Rosenthaler, H. R. Hidber, H.-J. Güntherodt   +8 more
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Magnetic force microscope images of magnetic domains in magnetic garnet

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena, 1997
Magnetic domains in (YGdBi)3(GaFe)5O12 magnetic garnet have been studied using magnetic force microscopy (MFM). MFM results have demonstrated that the undisturbed magnetic domain structure in the garnet could be obtained with a soft magnetic tip. It is further observed that the stray field emanating from a hard tip could magnetize the low-coercivity ...
F. Tian, C. Wang, G. Y. Shang, N. X. Wang, C. L. Bai   +4 more
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Three-Channel Non-Force Magnetic Microscope

AIP Conference Proceedings, 2003
The development of a scanning magnetic microscope (MM) without appreciable applied forces or magnetic excitations on specimens is presented. The magnetic microscope is intended to measure weak magnetic field distributions near the object surface at micron and submicron scales.
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Interpretation of magnetic force microscopic images (abstract)

Journal of Applied Physics, 1994
The authors have developed a magnetic force microscope (MFM) which works in a vacuum. By detecting the cantilever resonance frequency directly, it takes full advantage of the improved cantilever resonance quality, lowered noise level, and improved resolution, due to reduction of the air resistance that the cantilever suffers.
Atsushi Kikukawa, Hiroyuki Awano, Sumio Hosaka, Yukio Honda, Ryo Imura   +4 more
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A New Concept in Magnetic Force Microscope Cantilevers

2001
In this paper, a new design of dedicated magnetic force microscope (MFM) cantilever is presented. In this design, the cantilever and the magnetic tip are realized in an integrated manufacturing process. The use of silicon micromachining techniques enables batch fabrication of several hundred cantilevers on a single Si wafer.
van den Bos, A.G., van Dijk, A.C.J., Heskamp, I.R., Abelmann, Leon, Lodder, J.C.   +4 more
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