Results 271 to 280 of about 351,024 (329)
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Flux closure in magnetic force microscope tips
IEEE Transactions on Magnetics, 1995This work considers the effect of MFM tip magnetisation distribution on force gradient images of Co/Pt perpendicular anisotropy multilayer materials. In particular it is shown that a pyramidal tip with a Co coating which is thought to contain closure domain structures produces substantially different images from single domain CoPt coated tips ...
Tomlinson, S. L. +3 more
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A novel magnetic force microscope probe design
INTERMAG 2000 Digest of Technical Papers. 2000 IEEE International Magnetics Conference, 2000A new theoretical electromagnetic probe for the magnetic force microscope (MFM) is presented here. The magnetic field intensity normal to the probe, H/sub z/(Oe), has been modeled. The reciprocity principle was used to obtain the force acting on the sample due to the probe field when scanned over a magnetic specimen.
J.F.C. Windmill, W.W. Clegg
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Creating and detecting a magnetic bimeron by magnetic force microscope probe
Journal of Magnetism and Magnetic Materials, 2022M. V. Sapozhnikov +2 more
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Development of a magnetic levitation force microscope
Surface and Interface Analysis, 1999Classical atomic force microscopes use a soft cantilever spring to convert the interaction between a tip and a surface into a displacement. This leads to indirect force measurement and instability in the case of attractive forces. We have developed a new kind of force sensor to overcome these limitations.
B. Gauthier-Manuel, L. Garnier
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Microscale Localized Spectroscopy with a Magnetic Resonance Force Microscope
Physical Review Letters, 2005Magnetic resonance force microscopy is combined with spin-echo spectroscopy to obtain spatially and spectrally resolved NMR signals of micrometer-scale objects. The experimental spatial resolution for the demonstration experiment on a sample consisting of Ba(ClO3)2.H2O and (NH4)2SO4 single crystals is 3.4 microm.
C L, Degen +5 more
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Probe–Sample Coupling in the Magnetic Resonance Force Microscope
Journal of Magnetic Resonance, 2002The magnetic resonance force microscope (MRFM) provides a route to achieving scanned probe magnetic resonance imaging with extremely high spatial resolution. Achieving this capability will require understanding the force exerted on a microscopic magnetic probe by a spatially extended sample over which the probe is scanned.
Suter, A. +3 more
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Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena, 1994
Atomic scale surface as well as magnetic domain pattern studies have been carried out on nanocrystalline Fe86Zr7B6Cu and Fe73.5CuNb3Si13.5B9 melt cast ribbons by using scanning tunneling microscope and tunnel stabilized magnetic force microscope (TSMFM) techniques.
J. Nogués, B. Rodell, K. V. Rao
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Atomic scale surface as well as magnetic domain pattern studies have been carried out on nanocrystalline Fe86Zr7B6Cu and Fe73.5CuNb3Si13.5B9 melt cast ribbons by using scanning tunneling microscope and tunnel stabilized magnetic force microscope (TSMFM) techniques.
J. Nogués, B. Rodell, K. V. Rao
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Tracking a nanosize magnetic particle using a magnetic force microscope
2007 46th IEEE Conference on Decision and Control, 2007A scheme for tracking nano-sized magnetic particles using a magnetic force microscope (MFM) is introduced. The stray magnetic field of the particle induces a shift in the phase of the oscillation of the MFM tip. The magnitude of this shift depends on the distance between the tip and the particle and can be expressed as a spatial field.
Dimitar Baronov +2 more
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In situ magnetic hysteresis measurement of magnetic tips in magnetic force microscope
Journal of Magnetism and Magnetic Materials, 2002Abstract In situ magnetic hysteresis measurements of magnetic tips in a magnetic force microscope (MFM) are demonstrated using alternating gradient force magnetometry. The measured magnetic moments of MFM tips are estimated in the range from 10 −6 to 10 −5 emu by this technique and the whole MFM tips in cantilevers are considered to be measured ...
H. Saito, K. Miyazaki, S. Ishio
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