Application of randomized quadrature formulas to the finite element method for elliptic equations. [PDF]
Kruse R, Polydorides N, Wu Y.
europepmc +1 more source
An empirical‐aided active learning framework is developed to optimize high‐throughput laser‐induced photothermal annealing of silicon suboxide anodes. By integrating probabilistic machine learning with empirical domain knowledge, this approach achieves optimal electrochemical performance using limited experiments.
Chaeyoung Park +3 more
wiley +1 more source
Efficiency, accuracy and robustness of probability generating function based parameter inference method for stochastic biochemical reactions. [PDF]
Li S +5 more
europepmc +1 more source
Hierarchical Physical‐Cyber Encryption via Metasurface‐Encoded Holographic Keys
ABSTRACT Physical‐layer encryption based on metasurfaces has emerged as a promising alternative to conventional algorithmic cryptography by embedding security into physical processes. However, most existing metasurface‐based encryption schemes operate within single‐stage or static frameworks, where correct physical illumination directly reveals the ...
Zhen Liu +8 more
wiley +1 more source
Stochastic and Statistical Analysis of Cnoidal, Snoidal, Dnoidal, Hyperbolic, Trigonometric and Exponential Wave Solutions of a Coupled Volatility Option-Pricing System. [PDF]
Abdalgadir LM +3 more
europepmc +1 more source
Efficient Polarization‐Entangled Photon‐Pair Generation by a Fiber‐In‐Line van der Waals Material
Telecom‐wavelength polarization‐entangled photon pairs are generated in a van der Waals‐material‐integrated all‐fiber device via spontaneous parametric down‐conversion. The demonstrated fiberized quantum light source bridges emerging 2D nonlinear materials and practical quantum photonic systems, opening new opportunities for scalable fiber‐based ...
Jungseok Choi +11 more
wiley +1 more source
Intermittent Two-Point Dynamics at the Transition to Chaos for Random Circle Endomorphisms. [PDF]
Goverse VPH, Homburg AJ, Lamb JSW.
europepmc +1 more source
Pattern‐dependent etching is converted into a physical prior for intelligent reconstruction of high‐aspect‐ratio silicon structures. Combining YOLO‐Pose feature extraction with a topography network, the framework retrieves depth, sidewall angle, and scallop texture from minimal destructive observations, enabling accurate cross‐scale metrology and near ...
Shuyan He +4 more
wiley +1 more source
Counting particles in cryo-electron microscopy may result in incorrect population estimates. [PDF]
Evans L +5 more
europepmc +1 more source

