Results 131 to 140 of about 145,710 (264)

BMPCQA: Bioinspired Metaverse Point Cloud Quality Assessment Based on Large Multimodal Models

open access: yesAdvanced Intelligent Systems, EarlyView.
This study presents a bioinspired metaverse point cloud quality assessment metric, which simulates the human visual evaluation process to perform the point cloud quality assessment task. It first extracts rendering projection video features, normal image features, and point cloud patch features, which are then fed into a large multimodal model to ...
Huiyu Duan   +7 more
wiley   +1 more source

Autonomous Robotic Colonoscopy: A Supervised Learning Approach for Enhanced Navigation and Collision Detection

open access: yesAdvanced Intelligent Systems, EarlyView.
A novel autonomous robotic colonoscopy is introduced through supervised learning approaches. The proposed system consists of 3 degrees of freedom motorized colonoscope with an integrated navigation module that can infer a target steering point and collision probability.
Bohyun Hwang   +3 more
wiley   +1 more source

Device‐Level Implementation of Reservoir Computing With Memristors

open access: yesAdvanced Intelligent Systems, EarlyView.
Reservoir computing (RC) is an emerging computing scheme that employs a reservoir and a single readout layer, which can be actualized in the nanoscale with memristors. As a comprehensive overview, the principles of RC and the switching mechanisms of memristors are discussed, followed by actual demonstrations of memristor‐based RC and the remaining ...
Sunbeom Park, Hyojung Kim, Ho Won Jang
wiley   +1 more source

Metalearning‐Driven Inverse Optimization for Precision Microstructure Fabrication in Digital Light Processing Three‐Dimensional Printing

open access: yesAdvanced Intelligent Systems, EarlyView.
Metalearning‐based inverse optimization enables precise microscale three‐dimensional printing using a DLP system. Distorted structures from conventional printing are analyzed via neural network regression, which predicts optimal exposure time and mask design.
Jae Won Choi   +3 more
wiley   +1 more source

Machine Learning‐Driven Variability Analysis of Process Parameters for Semiconductor Manufacturing

open access: yesAdvanced Intelligent Systems, EarlyView.
This research presents a machine learning approach that integrates nonlinear variation decomposition (NLVD) with statistical techniques to quantify the contribution of individual unit processes to performance and variance of figure of merit (FoM) at the LOT level.
Sinyeong Kang   +6 more
wiley   +1 more source

Deep Learning Approaches for Classifying Crack States With Overload and Predicting Fatigue Parameters in a Titanium Alloy

open access: yesAdvanced Intelligent Systems, EarlyView.
This study proposes a deep learning approach to evaluate the fatigue crack behavior in metals under overload conditions. Using digital image correlation to capture the strain near crack tips, convolutional neural networks classify crack states as normal, overload, or recovery, and accurately predict fatigue parameters.
Seon Du Choi   +5 more
wiley   +1 more source

Integrating Artificial Intelligence With Droplet‐Based Microfluidics: Advances, Challenges, and Emerging Opportunities

open access: yesAdvanced Intelligent Systems, EarlyView.
Droplet‐based microfluidics enables precise, high‐throughput microscale reactions but continues to face challenges in scalability, reproducibility, and data complexity. This review examines how artificial intelligence enhances droplet generation, detection, sorting, and adaptive control and discusses emerging opportunities for clinical and industrial ...
Junyan Lai   +10 more
wiley   +1 more source

Data‐Driven Review and Machine Learning Prediction of Diamond Vacancy Center Synthesis

open access: yesAdvanced Intelligent Systems, EarlyView.
A machine learning framework is applied to photoluminescence spectra to extract linewidths and uncover how NV, SiV, GeV, and SnV centers evolve with growth and processing conditions. Unified normalization and k‐fold validation reveal cross‐method trends and enable rapid prediction of defect size and fabrication parameters, offering a data‐driven route ...
Zhi Jiang   +3 more
wiley   +1 more source

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