Results 161 to 170 of about 35,310,836 (192)
Mean Time Between Failure of Ring Arbiter with Requests Differing in Incidences [PDF]
In asynchronous arbiters, failures may happen, caused by metastable operations. The purpose of this study is to derive a formula to estimate such failures in a ring arbiter as mean time between failures (MTBF), under the condition that incidences of ...
Sato, Yoichiro
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Availability compliance testing of systems with long mean time between failures
Reliability Engineering, 1986Abstract Section 2 of this paper presents a simple way to design an availability compliance test terminated at a fixed time. Test parameters are selected by means of supplied nomograms. Section 3 contains a mathematical analysis of the test type in question with approximations adapted for systems with high availability ( >0ยท95 ).
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2017 International Conference on Modern Electrical and Energy Systems (MEES), 2017
The nature of the turn-to-turn short circuit in the windings of electric machines with long mean-time-between failures is specified. The choice of the methods for the diagnostics of the presence of short-circuited turns in the windings of electric machines in the process of their repair and current operation is substantiated.
Viacheslav Prus +2 more
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The nature of the turn-to-turn short circuit in the windings of electric machines with long mean-time-between failures is specified. The choice of the methods for the diagnostics of the presence of short-circuited turns in the windings of electric machines in the process of their repair and current operation is substantiated.
Viacheslav Prus +2 more
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Ten Year ESP Mean Time between Failures, Reality or Fiction
Abu Dhabi International Petroleum Exhibition & Conference, 2016Abstract Improving Electric Submersible Pump (ESP) system reliability, eliminating or reducing failures, comprise the most frequent requests from O&G operators. Over the last few decades, notable design improvements have been made with the use of computer aided design, rapid prototyping techniques, and use space age materials.
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Tables for Comparing Two Mean-Time-Between-Failures (MTBFs) for Unequal Test Times
1979Abstract : Tables of critical values for carrying out the exact method of comparing two MTBFs for unequal test times are tabulated for .001, .01, .05, . 10, and .20 levels of significance with the ratio of the two test times ranging from 0.1 to 5.0 by increments of 0.1 and the total failures ranging from 1 to 100.
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MIL-STD-781C and Confidence Intervals on Mean Time between Failures
1979Abstract : Various realistic examples illustrate how to obtain confidence limits on the mean time between failures (MTBF) of an exponential distribution from data obtained from one of the fixed-size or sequential test plans of MIL-STD- 871C. For fixed-length tests, the methods developed by B. Epstein and the modifications of H. L.
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Construction individual values chart by using mean time between failures with application
Qalaai Zanist Scientific Journal, 2017This study was conducted in order to use mean times of failure and another in the reliability in order to make chart individual values to quality control with the apply it. The study concluded with a conclusion that the average mean times of failure for production processes (tire factory) was in control case, because any of the samples did not locate ...
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J. Inf. Process. Cybern., 1986
A multicomponent system consisting of 1-out-of-2 and 1-out-of-3 subsystems is considered. All components are maintained individually. Their lifetimes and repair times are independent and identically distributed. The system fails if less than k subsystems are up or if less than \(\ell\) components are up.
Andreas Brandt 0001, Hannelore Sulanke
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A multicomponent system consisting of 1-out-of-2 and 1-out-of-3 subsystems is considered. All components are maintained individually. Their lifetimes and repair times are independent and identically distributed. The system fails if less than k subsystems are up or if less than \(\ell\) components are up.
Andreas Brandt 0001, Hannelore Sulanke
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On the mean time between failures for repairable systems
Microelectronics Reliability, 1987openaire +1 more source

