Results 261 to 270 of about 3,844,361 (299)
Some of the next articles are maybe not open access.
Mean time to failure of SnAgCuNi solder joints under DC
13th InterSociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, 2012Electromigration time to failure and electrical resistivity of 95.5%Sn-1.5%Ag-0.5%Cu-0.03W%Ni (SACN) microelectronics solder joints have been investigated experimentally. A Black's type electromigration time to failure equation is developed to describe the time to failure versus current density and temperature.
Cemal Basaran +3 more
openaire +1 more source
Determining the Mean Time to Failure for Certain Redundant Systems
A I I E Transactions, 1969Abstract A relatively simple relationship is presented for determining the mean time to failure for systems with redundancy of the type where r out of n units must be operating for the system to be operating. The special case is for units that have constant failure rates.
Philip Jumonville, William G. Lesso
openaire +1 more source
Mean Time to Failure for a Consecutive-k-out-of-n:F System
IEEE Transactions on Reliability, 1987A general formula is given for the mean time to failure of a consecutive- k-out-of-n:F system with equal component-failure probabilities. The special case of Weibull life distribution is examined.
Papastavridis, Stavros +1 more
openaire +2 more sources
Simulating System Mean‐Time‐to‐Failure on a Personal Computer
Computer Science Education, 1991Reliability is the probability that a component or system will operate successfully for a given length of time under specified conditions. Mean‐time‐to‐failure (MTTF) is the average life span of a typical representative of the system under study. We explore mathematical models of MTTF for frequently encountered configurations, including units in series,
Edward J. Fisher +2 more
openaire +1 more source
On the scalability and mean-time to failure of $k$ resilient protocols
Acta Informatica, 1997zbMATH Open Web Interface contents unavailable due to conflicting licenses.
Rangarajan, Sampath +2 more
openaire +1 more source
Microelectronics Reliability, 1996
This paper presents newly developed mean time to failure formulas for reliability networks such as series, parallel, k-out-of-n, series-parallel, parallel-series and a bridge with special case Erlangian distributed component failure times.
openaire +1 more source
This paper presents newly developed mean time to failure formulas for reliability networks such as series, parallel, k-out-of-n, series-parallel, parallel-series and a bridge with special case Erlangian distributed component failure times.
openaire +1 more source
Computation of Mean Time to Failure for a System with Simple Redundancy
IEEE Transactions on Reliability, 1986A system consisting of several independent components in series can be made more reliable by adding an ''identical'' component in parallel to some of the components. Two mathematical series are presented for computing the mean time to failure for the system when the failure times of the components are exponentially distributed.
Sweet, Arnold L. +2 more
openaire +2 more sources
Lifetime Testing, Redundancy, Reliability, and Mean Time to Failure
2013The environment of outer space is quite hostile to the many spacecraft that are now deployed in Earth orbit and beyond. There are many hazards in terms of severe thermal gradients, space weather from the sun and beyond, and intense radiation from the Van Allen belts as well as strong magnetic forces. Today, application satellites also must plan to cope
openaire +1 more source
Mean Time to Achieve a Failure-Free Requirement with Imperfect Repair
IEEE Transactions on Reliability, 1985Summary: This paper obtains expressions for the mean test time to achieve a failure-free requirement with imperfect repair, under two plans. First do complete repair (good as new) at an even number of failures and partial repair (bad as old) otherwise. Next do complete repair at every k-th failure and partial repair otherwise.
openaire +1 more source
Mean time to failure of metal oxide varistors under lightning stress
2003 IEEE Bologna Power Tech Conference Proceedings,, 2004The metal oxide varistors (MOVs) are the most used surge protective devices (SPDs) in order to limit the maximum voltage on protected circuits. Since many of the outages experienced on such circuits are due to overvoltages originated by direct and nearby lightning flashes, it is important to evaluate the reliability of such devices when stressed by ...
G. Luca Amicucei, B. D'Elia, P. Gentile
openaire +1 more source