Results 141 to 150 of about 225,299 (294)
In‐mold electronics (IME) undergo complex thermoforming and over‐molding processes that strain device integrity. This study demonstrates how adapting the amount and placement of structural adhesive to local deformation levels preserves electrical functionality.
Francisco Ituriel Arias‐García +3 more
wiley +1 more source
A practical approach example to measurement uncertainty: Evaluation of 26 immunoassay parameters. [PDF]
Tan R, Yilmaz M, Kurtulmuş Y.
europepmc +1 more source
By combining porous, solid, and carbon fiber‐reinforced thermoplastic polyurethane within a single 3D printed honeycomb structure, this current work achieved precise control over spatial stiffness while ensuring strong interlayer adhesion. The findings demonstrate enhanced energy absorption and densification strain, outperforming traditional uniform ...
Savvas Koltsakidis +2 more
wiley +1 more source
On the measurement uncertainty of microdosimetric quantities using diamond and silicon microdosimeters in carbon-ion beams. [PDF]
Meouchi C +8 more
europepmc +1 more source
On the reduction of total uncertainty in measurements
Carlos Ford-Livene Tadao Mukaihata
openalex +1 more source
Uncertainty in the maximum principal stress estimated from hydraulic fracturing measurements due to the presence of the induced fracture [PDF]
Jonny Rutqvist +2 more
openalex +1 more source
Achieving Large and Anisotropic Spin‐Mediated Thermal Transport in Textured Quantum Magnets
An advanced solvent‐cast cold pressing method is developed to synthesize highly textured quantum magnets. By aligning spin chains in Ca2CuO3 perpendicular to the pressing direction, a spin‐mediated thermal conductivity of 10 ± 1 W m⁻¹ K⁻¹ is achieved, the highest reported for polycrystalline quantum materials.
Shucheng Guo +6 more
wiley +1 more source
Reducing the need for repeating urine drug testing with the gray zone determined by the measurement uncertainty. [PDF]
Huysal K +3 more
europepmc +1 more source
Guidelines for evaluating and expressing the uncertainty of NIST measurement results
Barry N. Taylor
openalex +1 more source

