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Opportunities and Challenges in APT Metrology for Semiconductor Applications [PDF]
, 2019 Claudia Fleischmann +7 more
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Quantum enhanced metrology based on flipping trajectory of cold Rydberg gases. [PDF]
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Two-photon induced coherence without induced emission. [PDF]
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On-machine and in-process surface metrology for precision manufacturing
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A perspective on multiparameter quantum metrology: From theoretical tools to applications in quantum imaging [PDF]
Physics Letters, 2019 F. Albarelli +3 more
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Structure-in-Void Quasi-Bound State in the Continuum Metasurface for Deeply Subwavelength Nanostructure Metrology. [PDF]
ACS NanoBijloo F +3 more
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Fiber metrology and point sensing based on forward-stimulated Brillouin scattering
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Adapting the Electron Beam from SEM as a Quantitative Heating Source for Nanoscale Thermal Metrology
, 2020 Pengyu Yuan +5 more
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