Results 201 to 210 of about 226,839 (310)

Digital Metrology for Nanoindentation: Synthetic Data Generator for Error Identification. [PDF]

Micromachines (Basel)
Maculotti G, Giorio L, Genta G, Galetto M.   +3 more
europepmc   +1 more source

Hyper-spectral imaging with up-converted mid-infrared single-photons. [PDF]

Sci Rep
Meng Y, Jørgensen AA, Rasmussen AN, Høgstedt L, Friis SMM, Lassen M.   +5 more
europepmc   +1 more source

A quantum resistance memristor for an intrinsically traceable International System of Units standard. [PDF]

Nat Nanotechnol
Milano G, Zheng X, Michieletti F, Leonetti G, Caballero G, Oztoprak I, Boarino L, Bozat Ö, Callegaro L, De Leo N, Godinho I, Granados D, Koymen I, Menghini M, Miranda E, Ribeiro L, Ricciardi C, Suñe J, Cabral V, Valov I.   +19 more
europepmc   +1 more source

Metrology and Feature Analysis of Topic Selection for Master’s Degree Thesis in Engineering Management

Shuitai Xu, Yuhui Zhou
openalex   +1 more source

Upgrading Quantum Metrology by Combined Sensitivity Resources in Mixed Linear-Nonlinear Light-Matter Interactions with Bias Field [PDF]

Zu‐Jian Ying
openalex   +1 more source

Arbitrary thickness profile metrology of low-Z and monolithic material components with a single X-ray projection. [PDF]

J Synchrotron Radiat
Hao W, Wang F, Yu F, Du K, Li K, Fang J, Xiao T.   +6 more
europepmc   +1 more source

Data Sheet 1_Research trends on neutrophil extracellular traps in ischemic stroke: a scientific metrology study.docx

Yaji Xu (14112921), Xingyu Gong (9956213), Yilin Wang (490921), Xinyu Liu (34266), Haomou Pu (21074231), Hongjie Jiang (8457015), Xiaoping Yu (492352)   +6 more
openalex   +1 more source

Surface roughness profile separation using singular spectrum analysis. [PDF]

PLoS One
Pang Z, Gan X, Kong M.
europepmc   +1 more source

Computational metrology for materials. [PDF]

J Mater Res
Warren J, Read J, Seppala J, Strand E, Gershenfeld N.   +4 more
europepmc   +1 more source

Geometrical metrology for metal additive manufacturing

CIRP annals, 2019
R. Leach, D. Bourell, S. Carmignato, A. Donmez, N. Senin, W. Dewulf   +5 more
semanticscholar   +1 more source