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Integrated metrology for advanced manufacturing
CIRP Annals - Manufacturing TechnologyWei Gao, Andreas Archenti, Enrico Savio
exaly
Volume 3: Metrology and metrological instrumentation
2012 IEEE 11th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE), 2012openaire +1 more source
VIRTUAL METROLOGY APPARATUS, VIRTUAL METROLOGY METHOD, AND VIRTUAL METROLOGY PROGRAM
2022openaire +1 more source
METROLOGY METHOD AND ASSOCIATED METROLOGY DEVICE
TINNEMANS PATRICIUS, VAN PUTTEN EIBERTopenaire +3 more sources

