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An Imaging Microscope at 121.6nm
Optical Design and Fabrication 2017 (Freeform, IODC, OFT), 2017Optical design and system engineering of an imaging microscope with a Lyman-α source at 121.6nm is presented. Preliminary imaging experiments and results are shown, and future implementation of the system is discussed.
Weichuan Gao +5 more
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An image intensifier for the electron microscope
Journal of Physics E: Scientific Instruments, 1968An image intensifier system using a four-stage image intensifier optically coupled to a phosphor screen in the electron microscope is described. The system is shown to be limited by the quantum noise inherent in the electron image. The system can detect images down to 10 fA cm−2 which is at least an order of magnitude better than can be achieved by a ...
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Contrast in the Electron Microscope Image
Nature, 1958THE detail seen in a highly magnified electron micrograph is to-day limited more by a lack of contrast in the image than by any lack of resolution in the microscope, which is now usually capable of resolving objects at least as small as 15 A., that is, only a few atoms in diameter.
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Computation of scanning tunneling microscope images
International Journal of Quantum Chemistry, 1991This article describes the computation of the tunnel current in a scanning tunneling microscope (STM). The calculation accounts for the three-dimensional scattering taking place simultaneously in the first atomic layers of the sample and in the apex of the probing tip.
Derycke, Isabelle +4 more
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Commercial image analysers and the characterization of microscopical images
Journal of Microscopy, 1983SUMMARYThis review surveys some of the current approaches to the characterization of microscopical images using commercially available image analysers. The role of image pre‐processing and segmentation is considered, together with the characterization of images by optical density, as well as size and shape.The newer analysers are capable of ...
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Electron Microscopic Imaging of Integrin
2011Rotary-shadowed samples often used for electron microscopy do not preserve native integrin conformations. Negatively stained integrins - or, more desirably, unstained integrins in a cryo-condition - are now being used with sophisticated imaging techniques.
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The Optics of Microscope Image Formation
2003Although geometric optics gives a good understanding of how the microscope works, it fails in one critical area, which is explaining the origin of microscope resolution. To accomplish this, one must consider the microscope from the viewpoint of physical optics.
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Microscope image reconstruction
Signal Recovery and Synthesis, 1998In brightfield, phase-contrast or polarization microscopy, the image can be modeled by using scattering theory. The object, consisting of spatial variations in complex refractive index, scatters components of an angular spectrum of plane waves, and the image calculated by integration over incident and scattered waves.
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1999
Abstract Modern microscopes allow the attachment of a camera. Technology is avail-able to send acquired images directly to a computer for further processing. In these images object features such as length, area, or intensity can be measured with appropriate software. The measurement results can be used to classify objects or to determine
Stephanie L Ellenberger, Ian T Young
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Abstract Modern microscopes allow the attachment of a camera. Technology is avail-able to send acquired images directly to a computer for further processing. In these images object features such as length, area, or intensity can be measured with appropriate software. The measurement results can be used to classify objects or to determine
Stephanie L Ellenberger, Ian T Young
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Imaging Microscopes for Microelectronics
1990Various types of microscopes are used in microelectronics. These differ in the illumination fields used (vertical, oblique, darkfield, interferential, differential), light sources, iris and diaphragms, and filters (see Tables 6 and 7).
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