Results 231 to 240 of about 3,272,261 (293)

Electropulse-Driven Dislocation Evolution in Sub-10 nm Metallic Nanocrystals. [PDF]

Adv Sci (Weinh)
Hong Y, Zhai X, Li X, Zhang X, Song K, Zhang Z, Wang J.   +6 more
europepmc   +1 more source

Magnetic Properties in Co-Deposited Iron and Metal-Free Phthalocyanine Thin Films. [PDF]

Nanomaterials (Basel)
Chhom S, Cano K, Gredig T.
europepmc   +1 more source

Concluding remarks: <i>Good</i> vibrations at interfaces as probed with spectroscopy.

Faraday Discuss
Weckhuysen BM.
europepmc   +1 more source

Sustainable AFM-Based Nanolithography on Chitosan Thin Films for 2.5D and 3D Nanostructure Fabrication. [PDF]

Nanomaterials (Basel)
Vincenti L, Farella I, Cascione M, De Matteis V, Campa A, Bianco A, Martino M, Quaranta F, Bramanti AP, Rinaldi R, Pellegrino P.   +10 more
europepmc   +1 more source

Atomic force nanorheology for <i>in situ</i> exploration of nanoscale SEI layers in real-life rechargeable-battery electrodes.

Faraday Discuss
Nagarathinam M, Chen Y, Kolosov O.
europepmc   +1 more source

Atomic force microscopy

, 1995
openaire   +1 more source

Mapping nanomechanical properties of live cells using multi-harmonic atomic force microscopy [PDF]

Nature Nanotechnology, 2011
The nanomechanical properties of living cells, such as their surface elastic response and adhesion, have important roles in cellular processes such as morphogenesis(1), mechano-transduction(2), focal adhesion(3), motility(4,5), metastasis(6) and drug ...
Sonia Trigueros
exaly   +2 more sources

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Atomic Force Microscopy: An Introduction

2023
Imaging of nano-sized particles and sample features is crucial in a variety of research fields, for instance, in biological sciences, where it is paramount to investigate structures at the single particle level. Often, two-dimensional images are not sufficient, and further information such as topography and mechanical properties are required ...
Feng, Yuzhen, Roos, Wouter H
openaire   +3 more sources

Acoustic Microscopy by Atomic Force Microscopy

Applied Physics Letters, 1994
We have constructed an atomic force microscope enabling one to image the topography of a sample, and to monitor simultaneously ultrasonic surface vibrations in the MHz range. For detection of the distribution of the ultrasonic vibration amplitude, a part of the position-sensing light beam reflected from the cantilever is directed to an external knife ...
U. Rabe, W. Arnold
openaire   +1 more source