Results 281 to 290 of about 199,131 (311)

Introduction to Atomic Force Microscopy

2017
Atomic force microscopy (AFM) is a scanning probe microscopy developed in the 80s by Gerd Binnig, Calvin Quate and Christoph Gerber. It is certainly the most versatile scanning probe microscopy because it can be employed in many environments, from vacuum (to investigate surfaces with atomic resolution), to aqueous solution (for experiments in biology).
openaire   +2 more sources

Force spectroscopy of single cells using atomic force microscopy

Nature Reviews Methods Primers, 2021
Albertus Viljoen, Marion Mathelié-Guinlet, David Alsteens   +2 more
exaly  

Open the door to the atomic world by single-molecule atomic force microscopy

Matter, 2021
Siyuan Fang, Yun Hang Hu
exaly  

Generation, manipulation and characterization of molecules by atomic force microscopy

Nature Reviews Chemistry, 2017
Leo Gross, Niko Pavlicek, Gross Leo
exaly  

Harnessing the damping properties of materials for high-speed atomic force microscopy

Nature Nanotechnology, 2015
Georg Fantner, Juergen Brugger, Adrian Nievergelt   +2 more
exaly  

Determination of the elastic moduli of thin samples and adherent cells using conical atomic force microscope tips

Nature Nanotechnology, 2012
Núria Gavara, Richard Chadwick, Gavara Núria   +2 more
exaly  

Cryo-Atomic Force Microscopy

2002
Sitong, Sheng, Zhifeng, Shao
openaire   +2 more sources

Atomic Force Microscopy

Journal of the Japan Society of Colour Material, 2020
Ken NAKAJIMA, Kei SEKINE, Kaede MOGI, Makiko ITO, Xiaobin LIANG   +4 more
openaire   +1 more source

Calibration of atomic‐force microscope tips

Review of Scientific Instruments, 1993
John Bechhoefer, Bechhoefer John
exaly  

Atomic resolution on Si(111)-(7×7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork

Applied Physics Letters, 2000
Franz Giessibl, Giessibl Franz J
exaly