Results 281 to 290 of about 198,505 (311)

Introduction to Atomic Force Microscopy

2017
Atomic force microscopy (AFM) is a scanning probe microscopy developed in the 80s by Gerd Binnig, Calvin Quate and Christoph Gerber. It is certainly the most versatile scanning probe microscopy because it can be employed in many environments, from vacuum (to investigate surfaces with atomic resolution), to aqueous solution (for experiments in biology).
openaire   +2 more sources

Force spectroscopy of single cells using atomic force microscopy

Nature Reviews Methods Primers, 2021
Albertus Viljoen, Marion Mathelié-Guinlet, Ankita Ray   +2 more
exaly  

Generation, manipulation and characterization of molecules by atomic force microscopy

Nature Reviews Chemistry, 2017
Niko Pavlicek, Leo Gross, Gross Leo
exaly  

Harnessing the damping properties of materials for high-speed atomic force microscopy

Nature Nanotechnology, 2015
Juergen Brugger, Adrian P Nievergelt, Georg E Fantner   +2 more
exaly  

Determination of the elastic moduli of thin samples and adherent cells using conical atomic force microscope tips

Nature Nanotechnology, 2012
Núria Gavara, Richard S Chadwick, Gavara Núria   +2 more
exaly  

Cryo-Atomic Force Microscopy

2002
Sitong, Sheng, Zhifeng, Shao
openaire   +2 more sources

Atomic Force Microscopy

Journal of the Japan Society of Colour Material, 2020
Ken NAKAJIMA, Kei SEKINE, Kaede MOGI, Makiko ITO, Xiaobin LIANG   +4 more
openaire   +1 more source

Calibration of atomic‐force microscope tips

Review of Scientific Instruments, 1993
John Bechhoefer
exaly  

Atomic resolution on Si(111)-(7×7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork

Applied Physics Letters, 2000
Franz J Gießibl, Giessibl Franz J
exaly  

Application of atomic force microscopy in microscopic analysis of polysaccharide

Trends in Food Science and Technology, 2019
Junqiao Wang, Shaoping Nie
exaly