Results 191 to 200 of about 301,103 (232)
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2019
This chapter provides an overview of the concepts of scanning electron microscopy () from a theoretical as well as practical operational perspective. The theory section begins with the basics of image formation followed by an explanation of the interaction of the electron beam with the sample.
Rudolf Reichelt +2 more
+9 more sources
This chapter provides an overview of the concepts of scanning electron microscopy () from a theoretical as well as practical operational perspective. The theory section begins with the basics of image formation followed by an explanation of the interaction of the electron beam with the sample.
Rudolf Reichelt +2 more
+9 more sources
Optica Acta: International Journal of Optics, 1986
Abstract Scanning electron microscopy (SEM) has shown various significant improvements since it first became available in 1965. These improvements include enhanced resolution, dependability, ease of operation, and reduction in size and cost.
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Abstract Scanning electron microscopy (SEM) has shown various significant improvements since it first became available in 1965. These improvements include enhanced resolution, dependability, ease of operation, and reduction in size and cost.
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Journal of The Electrochemical Society, 1977
A detailed examination of materials is vital to any investigation relating to the processing properties and behavior of materials. Characterization includes all information relating to topographical features, morphology, habit and distribution, identification of differences based on chemistry, crystal structure, physical properties, and subsurface ...
E. K. Brandis, O. Johari
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A detailed examination of materials is vital to any investigation relating to the processing properties and behavior of materials. Characterization includes all information relating to topographical features, morphology, habit and distribution, identification of differences based on chemistry, crystal structure, physical properties, and subsurface ...
E. K. Brandis, O. Johari
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Scanning Electron Microscopy [PDF]
, 2003 Scanning electron microscopy (SEM) has a history almost as old as TEM, but the development of a commercial product took much longer. (1938) built the first SEM, and (1942) produced an SEM with a 50-nm probe. A group in Cambridge, England headed by Oatley began work in 1948 that led to the first commercial SEM (the Cambridge Stereoscan) in 1965.
Laura E. Reuss, Michael J. Dykstra
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Scanning Electron Microscopy of Cells
Science, 1969The scanning electron energy-analyzing microscope uses characteristic energy losses to provide picture contrast. At different levels of energy loss particular structures are distinguished with high contrast in an unstained section of a cell.
Duane A. Habeck +5 more
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1975
The scanning electron microscope (sem) is an instrument designed primarily for studying the surfaces of solids at high magnification. In this respect it may be compared with the optical microscope, and a set of micrographs taken on each instrument is shown in figure 2.1.
D. K. Bowen, C. R. Hall
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The scanning electron microscope (sem) is an instrument designed primarily for studying the surfaces of solids at high magnification. In this respect it may be compared with the optical microscope, and a set of micrographs taken on each instrument is shown in figure 2.1.
D. K. Bowen, C. R. Hall
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2004
AbstractThis article outlines the beam/sample interactions and the basic instrumental design of a scanning electron microscopy (SEM), which include the electron gun, probeforming column (consisting of magnetic electron lenses, apertures, and scanning coils), electron detectors, and vacuum system.
S. Weinbruch, H.E. Exner
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AbstractThis article outlines the beam/sample interactions and the basic instrumental design of a scanning electron microscopy (SEM), which include the electron gun, probeforming column (consisting of magnetic electron lenses, apertures, and scanning coils), electron detectors, and vacuum system.
S. Weinbruch, H.E. Exner
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2018
The scanning electron microscope (SEM) is the most widely used tool for characterizing and analyzing the surface of solid samples. It is utilized in many research areas as well as in various industry sectors. Using the SEM, material scientists can study nanoscale features of their samples, which enables them to gain knowledge of the formation and ...
Wei Han, Daniel Fox, Huisheng Jiao
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The scanning electron microscope (SEM) is the most widely used tool for characterizing and analyzing the surface of solid samples. It is utilized in many research areas as well as in various industry sectors. Using the SEM, material scientists can study nanoscale features of their samples, which enables them to gain knowledge of the formation and ...
Wei Han, Daniel Fox, Huisheng Jiao
openaire +2 more sources