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Scanning electron mirror microscopy and scanning electron microscopy of integrated circuits
IEEE Transactions on Electron Devices, 1969The recently developed scanning electron mirror microscope (SEMM) is compared with other types of electron microscopes, such as the electron mirror microscope (EMM) and the scanning electron microscope (SEM), for examining integrated circuits. Potential advantages of the SEMM include high resolution, elimination of electron bombardment damage, and high
J.E. Cline, J.M. Morris, S. Schwartz
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Immunogold Labeling for Scanning Electron Microscopy
2010Scanning electron microscopes are useful biological tools that can be used to image the surface of whole organisms, tissues, cells, cellular components, and macromolecules. Processes and structures that exist at surfaces can be imaged in pseudo, or real 3D at magnifications ranging from about 10× to 1,000,000×. Therefore a whole multicellular organism,
Martin W, Goldberg, Jindriska, Fiserova
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Scanning Electron Microscopy and Bone
This chapter discusses methods for preparing samples of bone and bone cells for scanning electron microscopy (SEM). Backscattered electron (BSE) imaging is by far the most useful in the bone field, followed by secondary electrons (SE) and the energy dispersive X-ray (EDX) analytical modes. Samples may have detail in a 3D surface, or be topography-free,openaire +2 more sources
Scanning electron microscopy of chondrocytes
Cells Tissues Organs, 1972M L, Zimmy, I, Redler
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Rapid 40S scanning and its regulation by mRNA structure during eukaryotic translation initiation
Cell, 2022Thomas E Dever +2 more
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