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Scanning Transmission Electron Microscopy

2008
The scanning transmission electron microscope () has become one of the preeminent instruments for high spatial resolution imaging and spectroscopy of materials, most notably at atomic resolution. The principle of STEM is quite straightforward. A beam of electrons is focused by electron optics to form a small illuminating probe that is raster-scanned ...
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Advanced Transmission Electron Microscopy

2017
In this chapter, starting with the basic theory of electron energy loss spectroscopy (EELS), we study the advanced topics in TEM such as energy-filtered TEM, electron holography, electron tomography, and aberration-corrected TEM.
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Transmission Electron Microscopy.

Zeitschrift für Kristallographie - Crystalline Materials, 1995
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