Results 71 to 80 of about 395,580 (258)
Transmission Electron Microscopy
The ultimate resolution of any imaging technique is limited to about the wavelength of the radiation which carries the information. For light, the wavelength is on the order of 500 nm. However, modern science demands information from samples at far higher resolution—in the limit, it would be ideal to image individual atomic positions in crystals ...
openaire +3 more sources
Aberration correction for low voltage optimized transmission electron microscopy
Further development of low voltage electron microscopy leads to an aberration correction of the device in order to improve its spatial resolution. The integration of a corrector to a desktop transmission electron microscope with exclusively low-voltage ...
Jaromír Bačovský
doaj +1 more source
Experiments and thermophysical simulations were conducted to investigate the electron beam powder bed fusion electron beam (PBF‐EB/M) process for the γ′‐strengthened nickel‐based superalloy Inconel 738LC. The results demonstrate the impact of process‐induced microstructural variations on high‐temperature mechanical behavior, providing a basis for ...
Jan Niklas Petenati +11 more
wiley +1 more source
Analysis and applications of a heralded electron source
We analytically describe the noise properties of a heralded electron source made from a standard electron gun, a weak photonic coupler, a single photon counter, and an electron energy filter.
Stewart A Koppell +5 more
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Preparation of Candida albicans Biofilms for Transmission Electron Microscopy
Transmission Electron Microscopy is a form of microscopy that allows for imaging of distinct portions of an individual cell. For Candida albicans biofilms, it is often used to visualize the cell walls of fixed samples of yeast and hyphae.
Heather Taff, David Andes
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Noise2Atom: unsupervised denoising for scanning transmission electron microscopy images
We propose an effective deep learning model to denoise scanning transmission electron microscopy (STEM) image series, named Noise2Atom, to map images from a source domain S $\mathcal {S}$ to a target domain C $\mathcal {C}$ , where S $\mathcal {S}$ is ...
Feng Wang +3 more
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Deep‐UV (258 nm) femtosecond pulses enable uniform amorphous silicon writing on Si(100)/(111) with a six‐fold larger fluence amorphization window than NIR methods. Optimized fluence and overlap yield 20–45 nm uniform and continuous amorphous layers. Microscopy shows sharp interfaces, and real‐time reflectivity reveals nanosecond melt–resolidification ...
Wissal Benali +5 more
wiley +1 more source
Transmission Electron Microscopy (TEM) Protocol: Observation Details within Cells
Transmission electron microscopy is a technique for observing the fine details of organelles in cells or tissues. This protocol is to be used to exam the membrane structure in cells with or without virus infection.
Wei-Haw Peng +4 more
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Self‐Cleaning Sensor Surfaces for Long‐Term Environmental Monitoring
Long‐term use of unattended outdoor sensors without soiling or biofouling is achieved through generation of a micro‐ and nanorough cuvette surface by combing hydrophobic nanoparticles with fluorinated polymers, crosslinked and surface‐attached through CHic chemistry. The coating demonstrates self‐cleaning behavior and prolonged outdoor stability, which
Sanam Kumari Rajak +4 more
wiley +1 more source
Efficient diffractive phase optics for electrons
Electron diffraction gratings can be used to imprint well-defined phase structure onto an electron beam. For example, diffraction gratings have been used to prepare electron beams with unique phase dislocations, such as electron vortex beams, which hold ...
Tyler R Harvey +5 more
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