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Status and review of two-dimensional carrier and dopant profiling using scanning probe microscopy
Journal of Vacuum Science & Technology an Official Journal of the American Vacuum Society B, Microelectronics Processing and Phenomena, 2000exaly
Quantification of topographic structure by scanning probe microscopy
Journal of Vacuum Science & Technology an Official Journal of the American Vacuum Society B, Microelectronics Processing and Phenomena, 1997exaly
Analytical Methods in Supramolecular Chemistry, 2012
Hoffmann, R., Hermann, B. A.
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Hoffmann, R., Hermann, B. A.
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