Results 251 to 260 of about 1,625,840 (288)
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1992
Abstract : Scanning tunneling microscopy (STM) has been used to image and modify the surfaces of III-V, II-VI and group IV semiconductors. A tip-simulator based on a photocode was developed. The simulator allows the development of ultra- sensitive electronics for controlling STM tip movement.
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Abstract : Scanning tunneling microscopy (STM) has been used to image and modify the surfaces of III-V, II-VI and group IV semiconductors. A tip-simulator based on a photocode was developed. The simulator allows the development of ultra- sensitive electronics for controlling STM tip movement.
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Scanning Tunnelling Microscopy
1990Since its introduction by Binnig et al.,(1) the Scanning Tunnelling Microscope (STM) has engendered much excitement among surface scientists, not only for the atomically resolved surface topography it can achieve, but also for the range of surface spectroscopy possible.
M. E. Welland, M. E. Taylor
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2018
STM is a surface microscope with extremely high spatial resolution, which enables us to see atoms on surfaces. When a sharp metal needle is located at a very proximate distance (~1 nm) from the sample surface (left panel in Fig. 97.1), tiny amount of electrical flow, called a tunneling current, is induced between them. Since the current is so sensitive
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STM is a surface microscope with extremely high spatial resolution, which enables us to see atoms on surfaces. When a sharp metal needle is located at a very proximate distance (~1 nm) from the sample surface (left panel in Fig. 97.1), tiny amount of electrical flow, called a tunneling current, is induced between them. Since the current is so sensitive
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Scanning Tunnelling Microscopy
1992The scanning tunnelling microscope, or STM, has emerged over the last few years as a fascinating new technique for examining conducting solid surfaces with high resolution [10.1–5]. A sharpened metal wire is brought close enough to the surface so that the electrons “tunnel” across the narrow gap (0.5–1.5 nm).
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SCANNING TUNNELING MICROSCOPY AND SCANNING FORCE MICROSCOPY
2006Hembacher, Stefan, Giessibl, Franz Josef
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Scanning Tunneling Microscopy of Biopolymers
2003T J, McMaster, V J, Morris
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Probing Semiconductor Properties with Optical Scanning Tunneling Microscopy
Joule, 2020Sarah Wieghold, Lea Nienhaus
exaly