Results 181 to 190 of about 30,799 (287)

X‐Functionality–Driven Photocatalytic Hydrogen Evolution in 2D 4‐X‐PEA2SnI4 Perovskites

open access: yesAdvanced Functional Materials, EarlyView.
We report a water‐based synthesis of 2D 4‐X‐PEA2SnI4 perovskite microcrystals with prominent photocatalytic (PC) activity for H2 production. The synergy between organic functionalization and HI‐derived iodide scavenges holes suppress octahedral distortion, and favor electron accumulation, enabling a PC H2 evolution ∼20 µmol·g−1 and long‐term stability ...
Taeyeon Kim   +21 more
wiley   +1 more source

Curvature‐Tuned Friction at Electrified Ionic Liquid Interfaces

open access: yesAdvanced Functional Materials, EarlyView.
Graphene curvature plays a key role in friction electrotunability at single‐asperity contacts lubricated by ionic liquids. A 9 nm radius yields stronger tunability than larger radii, with distinct friction coefficients at low and high loads indicating a shift in the slippage plane.
Wei Song   +6 more
wiley   +1 more source

3D‐Printed Hygroscopic Polymer Networks for High‐Humidity Triboelectric Nanogenerators to Wirelessly Power Implantable Electronic Devices‐ A Conceptual Pathway

open access: yesAdvanced Functional Materials, EarlyView.
This work develops 3D‐printable tribopolymer networks that can enhance triboelectric performance under high humidity environments. Polar hydrophilic functional groups and incorporation of zwitterionic monomers promote bound‐water–dominated interfacial polarization thereby increasing electrical outputs.
Linguangze Zhuo   +8 more
wiley   +1 more source

Design of an RRAM-Based Joint Model for Embedded Cellular Smartphone Self-Charging Device. [PDF]

open access: yesMicromachines (Basel)
Vishwakarma A   +4 more
europepmc   +1 more source

SOLAR CHARGER FOR MOBILE PHONE BATTERY

open access: yesScience-based technologies, 2010
openaire   +1 more source

Tracing Sub‐Monolayer Contamination on Wafer‐Scale 2D Materials

open access: yesAdvanced Functional Materials, EarlyView.
Sub‐monolayer adventitious carbon contamination limits the performance and reproducibility of 2D material‐based devices. This study demonstrates scanning helium microscopy (SHeM) as a non‐destructive, ultra‐sensitive tool for wafer‐scale imaging of surface cleanliness.
Chenyang Zhao   +7 more
wiley   +1 more source

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