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SMTA International, 2011
ABSTRACT There are three key industry trends that are driving the need for temperature-dependent warpage measurement: the trend toward finer-pitch devices, the emergence of lead-free processing, and changes in device form factors. Warpage measurement has become a key measurement for analysis, prevention and prediction of interconnect ...
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ABSTRACT There are three key industry trends that are driving the need for temperature-dependent warpage measurement: the trend toward finer-pitch devices, the emergence of lead-free processing, and changes in device form factors. Warpage measurement has become a key measurement for analysis, prevention and prediction of interconnect ...
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SPIE Proceedings, 2011
Recording of periodic structures is employed, instead of printing techniques, for moire pattern to be generated. Diffraction gratings are utilized not only as substitutes of printing inks here but also to employ variation of visual appearance for revealing information encoded in a data-carrier structure. Two designs are analysed - one relying on very
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Recording of periodic structures is employed, instead of printing techniques, for moire pattern to be generated. Diffraction gratings are utilized not only as substitutes of printing inks here but also to employ variation of visual appearance for revealing information encoded in a data-carrier structure. Two designs are analysed - one relying on very
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Composites Science and Technology, 2000
Abstract The deformation along cylindrical surfaces of holes in tensile-loaded laminated composite specimens was measured by means of new moire interferometry techniques. Two composite tensile specimens, fabricated from IM7/5250-4 pre-preg with ply lay-ups of [04/904]3s and [+302/−302/904]3s, were examined by newly developed moire interferometry ...
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Abstract The deformation along cylindrical surfaces of holes in tensile-loaded laminated composite specimens was measured by means of new moire interferometry techniques. Two composite tensile specimens, fabricated from IM7/5250-4 pre-preg with ply lay-ups of [04/904]3s and [+302/−302/904]3s, were examined by newly developed moire interferometry ...
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Superresolution Spectroscopy of Atomically Thin Semiconductors and Moiré Heterostructures
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