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Mueller Matrix Ellipsometry Revisited
SPIE Proceedings, 1987The object of ellipsometry is to determine the complex ratio ρ (ρ=tanifi exp(i&) ) of the reflected or transmitted polarization state parameters. Ellipsometry has traditionally been used as a tool for measuring the optical constants (n,k) of a surface, or when given the optical constants of the substrate, to determine some property such as the ...
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Mueller matrix decomposition methods for tissue polarization tomography
Optics and Lasers in Engineering, 2021Wanrong Gao
exaly
Advanced Mueller matrix ellipsometry: Instrumentation and emerging applications
Science China Technological Sciences, 2022Honggang Gu, Shiyuan Liu, Xiuguo Chen
exaly
Mueller matrix spectroscopic ellipsometry
Advanced Optical Technologies, 2022James Hilfiker +2 more
exaly
Physical Quantities in a Mueller Matrix
2017José J. Gil Pérez, Razvigor Ossikovski
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Particulate Mueller matrix polarimetry
Optics and Laser Technology, 2023Ran Liao, Hongyuan Wang
exaly

