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Dielectric tensor measurement from a single Mueller matrix image
Journal of the Optical Society of America A, 2007A technique for measuring dielectric tensors in anisotropic layered structures, such as thin films of biaxial materials, is demonstrated. The ellipsometric data are collected in a quasi-monochromatic Mueller matrix image acquired over a large range of incident and azimuthal angles by illuminating a very small area on the sample with a focused beam from
Neil A, Beaudry +2 more
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Ptychographic Mueller matrix imaging: in-situ system calibration and evaluation
Optics LettersCalibration is crucial for accurate polarimetric systems. In this Letter, we propose a hybrid strategy to in-situ calibrate the ptychographic Mueller matrix imaging (PMMI) system [Opt. Lett. 49, 6409 (2024)10.1364/OL.539100], extending our previous work.
Ming Gong +6 more
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Lensless inline holographic Mueller matrix imaging
Optical Review, 2023Yong Fang, Wei Li, Jinye Li, Juntao Hu
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Investigation on the Potential of Mueller Matrix Imaging for Digital Staining
Journal of Biophotonics, 2016Quan Liu +2 more
exaly
Double-Pass Axially Resolved Confocal Mueller Matrix Imaging Polarimetry
Optics Letters, 2005Chris Dainty
exaly
Near Infra-Red Mueller Matrix Imaging System and Application to Retardance Imaging of Strain
Thin Solid Films, 2011Lars Martin Sandvik Aas
exaly