Results 131 to 140 of about 594 (165)
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Characterization of cervical tissue using Mueller matrix polarimetry
Lasers in Medical Science, 2023The cervix is composed of layers of squamous epithelium and connective tissue. The main component of the cervical connective tissue is collagen, which has specific orientations in different parts of the cervix and provides mechanical strength. Cervical pathologies such as cervical intraepithelial neoplasia (CIN), cancer, pregnancy, and spontaneous ...
Sumera Khan +4 more
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SPIE Proceedings, 2005
The main goal of the present paper is an answer the question how one have exactly to measure the Mueller matrix elements and what characteristics the polarimeter must have for the determination of anisotropy of the studied medium with minimal error and time of measurement.
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The main goal of the present paper is an answer the question how one have exactly to measure the Mueller matrix elements and what characteristics the polarimeter must have for the determination of anisotropy of the studied medium with minimal error and time of measurement.
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Mueller and Kennaugh matrices in radar polarimetry
IEEE Transactions on Geoscience and Remote Sensing, 1994This paper is concerned with the notions of the Mueller matrix and the Kennaugh (or Stokes scattering) matrix, that are commonly used in the field of radar polarimetry. Although these two matrices are quite similar, there exists a basic difference between them that seems to have been overlooked by a number of researchers, resulting in a great deal of ...
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Mueller matrix imaging polarimetry
Optical Engineering, 1995The design and operation of a Mueller matrix imaging polarimeter is presented. The instrument is configurable to make a wide variety of polarimetric measurements of optical systems and samples. In one configuration, it measures the polarization properties of a set of ray paths through a sample.
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Mueller polarimetry in the back focal plane
SPIE Proceedings, 2007A new Mueller polarimeter based on liquid crystals and a microscope objective is presented, for the characterization of diffraction gratings in a conical diffraction mounting. Fast measurements of complete Mueller matrices over a range of polar angles (0-56°) and azimuthal angles (0-360°) are achieved without mechanical movements.
A. De Martino, S. Ben Hatit, M. Foldyna
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Mueller Polarimetry of Chiral Supramolecular Assembly
The Journal of Physical Chemistry C, 2018Supramolecular organizations of achiral molecules are known to undergo spontaneous mirror symmetry breaking, materializing chiral macroscopic structures with enantiomeric excess. Using Mueller polarimetry, we show that the hierarchy at play in the self-assembly of an achiral amphiphilic cyanine molecule, C8O3, can be encoded in a hierarchical evolution
Thomas, Anoop +6 more
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Channeled partial Mueller matrix polarimetry
SPIE Proceedings, 2015In prior work,1,2 we introduced methods to treat channeled systems in a way that is similar to Data Reduction Method (DRM), by focusing attention on the Fourier content of the measurement conditions. Introduction of Q enabled us to more readily extract the performance of the system and thereby optimize it to obtain reconstruction with the least noise ...
Andrey S. Alenin, J. S. Tyo
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Stokes-vector and Mueller-matrix polarimetry [Invited]
Journal of the Optical Society of America A, 2016This paper reviews the current status of instruments for measuring the full 4×1 Stokes vector S, which describes the state of polarization (SOP) of totally or partially polarized light, and the 4×4 Mueller matrix M, which determines how the SOP is transformed as light interacts with a material sample or an optical element or system.
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Terahertz Mueller Matrix Polarimetry and Polar Decomposition
IEEE Transactions on Terahertz Science and Technology, 2020Mueller matrix imaging, as one of the polarimetric imaging modalities, is an effective tool to achieve imaging enhancement as well as explore fine details of the imaged sample at microwave and optical frequencies. However, little work has been reported at terahertz (THz) frequencies, which could provide an exclusive insight in exploring fine details of
Shao-Xin Huang +7 more
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Overlay measurement by angle resolved Mueller polarimetry
SPIE Proceedings, 2011The use of optical metrology techniques for process control is now widespread. These techniques are fast and nondestructive, allowing higher throughputs than non-optical techniques like electron microscopies or AFM. We present here new developments using complete Mueller polarimetry in the back focal plane of a microscope objective to characterize ...
Clément Fallet +5 more
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