Results 231 to 240 of about 402,756 (276)

LFA: A Lattice Fourier Analyzer for Quantitative In Situ EC‐STM of Adsorbate–Substrate Superstructures

open access: yesAdvanced Materials Interfaces, EarlyView.
Although electrochemical scanning tunneling microscopy provides atomic‐scale access to electrified interfaces, quantitative in situ and operando investigations suffer from drift‐induced distortions. This work introduces the Lattice Fourier Analyzer (LFA), which employs substrate‐anchored affine drift correction in reciprocal space to recover precise ...
Rafał Lewandków   +4 more
wiley   +1 more source

Topological Point Defects in SmC* Liquid Crystals Under Mechanical Disturbance

open access: yesAdvanced Materials Interfaces, EarlyView.
Tangetial air jet shear inducess island formation and nucleates topological point defects in uniform SmC films. Island bounded by edge dislocation loops shrink and transform into isolated point defects under continued shear. Mechanical perturbatio provides a controllable route for defect engineering in smectric liquid crystal thin films.
Gunganist Kongklad   +3 more
wiley   +1 more source

Home - About - Disclaimer - Privacy