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Nanomaterials, 2022 Apart from being the subject of this Special Issue, what is nanometrology [...]
Petr Klapetek
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Proceedings of the International School of Physics “Enrico Fermi”, 2013 Methods and protocols are described when using fluorescence metrology to determine the average nanoparticle (np) size in colloids in the range of 1–10 nm.
Birch, David J. S., Yip, Philip
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Nanometrology and its perspectives in environmental research [PDF]
Environmental Health and Toxicology, 2014 Objectives Rapid increase in engineered nanoparticles (ENPs) in many goods has raised significant concern about their environmental safety. Proper methodologies are therefore needed to conduct toxicity and exposure assessment of nanoparticles in the ...
Hyun-A Kim +3 more
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Ethical Challenges in Nanometrology [PDF]
Communications - Scientific letters of the University of Zilina, 2018 Nanometrology is an intrinsic and fast developing part of nanoscience. Given the huge diversity of nanostructures ranging from large molecules from about 10 atoms to structures from 105 atoms (particles of the size ≤ 100 nm), broader investigations in this area cannot be exactly scrutinized nor repeated by the existing capacities. This gave rise to the
Š. Luby +3 more
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Co-Nanomet: Co-ordination of Nanometrology in Europe [PDF]
, 2011 Nanometrology is a subfield of metrology, concerned with the science of measurement at the nanoscale level. Today’s global economy depends on reliable measurements and tests, which are trusted and accepted internationally. It must provide the ability to
Boyd, Rob +19 more
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New design of operational MEMS bridges for measurements of properties of FEBID-based nanostructures [PDF]
Beilstein Journal of NanotechnologyFocused electron beam-induced deposition (FEBID) is a novel technique for the development of multimaterial nanostructures. More importantly, it is applicable to the fabrication of free-standing nanostructures.
Bartosz Pruchnik +8 more
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Conductive Atomic Force Microscopy—Ultralow-Current Measurement Systems for Nanoscale Imaging of a Surface’s Electrical Properties [PDF]
SensorsOne of the most advanced and versatile nanoscale diagnostic tools is atomic force microscopy. By enabling advanced imaging techniques, it allows us to determine various assets of a surface, including morphological, electrical, mechanical, magnetic, and ...
Andrzej Sikora +6 more
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Through Silicon MEMS Inspection with a Near-Infrared Laser Scanning Setup [PDF]
SensorsThe inspection of encapsulated MEMS devices typically relies on destructive methods which compromise the structural integrity of samples. In this work, we present the concept and preliminary experimental validation of a laser scanning setup to non ...
Manuel J. L. F. Rodrigues +5 more
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Wavelet-based information theory in quantitative assessment of AFM images’ quality [PDF]
Scientific ReportsThe quantitative assessment of the image quality produced by atomic force microscopy (AFM) is an ongoing and challenging task. In our study, we demonstrate Shannon’s application of information theory for measuring image quality.
Bartosz Czesław Pruchnik +2 more
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Bayesian inference for plasmonic nanometrology
Physical Review A, 2021 We introduce a Bayesian method for the characterization of plasmonic nanoparticles, which is applicable to both near- and far-field problems. Designed to combine data generated from any photon-plasmon interaction experiment with physically motivated theoretical models, our approach leverages state-of-the-art Markov chain Monte Carlo sampling techniques
Joseph M. Lukens, Ali Passian
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