Results 1 to 10 of about 4,233 (222)
Nanomaterials, 2022 Apart from being the subject of this Special Issue, what is nanometrology [...]
Petr Klapetek
doaj +5 more sources
Proceedings of the International School of Physics “Enrico Fermi”, 2013 Methods and protocols are described when using fluorescence metrology to determine the average nanoparticle (np) size in colloids in the range of 1–10 nm.
Birch, David J. S., Yip, Philip
core +7 more sources
New design of operational MEMS bridges for measurements of properties of FEBID-based nanostructures [PDF]
Beilstein Journal of NanotechnologyFocused electron beam-induced deposition (FEBID) is a novel technique for the development of multimaterial nanostructures. More importantly, it is applicable to the fabrication of free-standing nanostructures.
Bartosz Pruchnik +8 more
doaj +2 more sources
Conductive Atomic Force Microscopy—Ultralow-Current Measurement Systems for Nanoscale Imaging of a Surface’s Electrical Properties [PDF]
SensorsOne of the most advanced and versatile nanoscale diagnostic tools is atomic force microscopy. By enabling advanced imaging techniques, it allows us to determine various assets of a surface, including morphological, electrical, mechanical, magnetic, and ...
Andrzej Sikora +6 more
doaj +2 more sources
Microcantilever-based current balance for precise measurement of the photon force [PDF]
Scientific Reports, 2023 We present a method for the quantitative determination of the photon force (PF)—the force generated by the radiation pressure of photons reflected from the surface.
Bartosz Pruchnik +6 more
doaj +2 more sources
Through Silicon MEMS Inspection with a Near-Infrared Laser Scanning Setup [PDF]
SensorsThe inspection of encapsulated MEMS devices typically relies on destructive methods which compromise the structural integrity of samples. In this work, we present the concept and preliminary experimental validation of a laser scanning setup to non ...
Manuel J. L. F. Rodrigues +5 more
doaj +2 more sources
Wavelet-based information theory in quantitative assessment of AFM images’ quality [PDF]
Scientific ReportsThe quantitative assessment of the image quality produced by atomic force microscopy (AFM) is an ongoing and challenging task. In our study, we demonstrate Shannon’s application of information theory for measuring image quality.
Bartosz Czesław Pruchnik +2 more
doaj +2 more sources
Synthetic Data in Quantitative Scanning Probe Microscopy
Nanomaterials, 2021 Synthetic data are of increasing importance in nanometrology. They can be used for development of data processing methods, analysis of uncertainties and estimation of various measurement artefacts.
David Nečas, Petr Klapetek
doaj +1 more source
Nanometrology and its perspectives in environmental research [PDF]
Environmental Health and Toxicology, 2014 Objectives Rapid increase in engineered nanoparticles (ENPs) in many goods has raised significant concern about their environmental safety. Proper methodologies are therefore needed to conduct toxicity and exposure assessment of nanoparticles in the ...
Hyun-A Kim +3 more
doaj +1 more source
Applied Sciences, 2021 Attempts are made in this paper to improve the quality of the stitching between adjacent arc-profiles in the stitching linear-scan method for the roundness measurement of a cylinder in a small dimension.
Qiaolin Li +5 more
doaj +1 more source