Results 201 to 210 of about 4,739 (252)

Estimation of measurement uncertainty in the field of atomic force microscopy in dimensional nanometrology

Andrej Razumić
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Single-cavity loss-enabled nanometrology

Nature Nanotechnology
Optical monitoring of the position and alignment of objects with a precision of only a few nanometres is key in applications such as smart manufacturing and force sensing. Traditional optical nanometrology requires precise nanostructure fabrication, multibeam interference or complex postprocessing algorithms, sometimes hampering wider adoption of this ...
Jipeng Xu, Yuanhao Mao, Zhipeng Li, Yunlan Zuo, Jianfa Zhang, Biao Yang, Wei Xu, Ning Liu, Zhi Jiao Deng, Wei Chen, Keyu Xia, Cheng-Wei Qiu, Zhihong Zhu, Hui Jing, Ken Liu   +14 more
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Hyperspectral X-ray imaging for nanometrology

Kristallografiâ
A tool for X-ray hyperspectral imaging has been developed. It is based on a conventional CCD driven by an algorithm that allows resolution in both energy and position. A new algorithm has been developed that allows the real-time analysis of single photon events.
A. I. Safonov, K. V. Nikolaev, S. N. Yakunin   +2 more
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Nanometrological porphyrins

Nanotechnology, 2012
A new cationic silver N-alkylpyridylporphyrin complex is able to 'sense' nanometric conductive particles with a diameter below 10 nm. The luminescence of the molecule changes its maximum from red to blue when it embraces a conductive (metallic or semiconducting) nanoparticle.
G A M, Safar, Y M, Idemori, D, CarvalhoDa-Silva, J S, Rebouças, M S C, Mazzoni, A, Righi   +5 more
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Bottom-Up Generated Height Gauges for Silicon-Based Nanometrology.

ACS Applied Materials and Interfaces, 2023
Steady progress in integrated circuit design has forced basic metrology to adopt silicon lattice parameter as a secondary realization of the SI meter that lacks convenient physical gauges for precise surface measurements at a nanoscale.
D. Sheglov, D. Rogilo, L. Fedina, S. Sitnikov, E. Sysoev, A. Latyshev   +5 more
semanticscholar   +1 more source

Nanometrology for evaluating rare sites for molecular homogeneity

Advanced Lithography, 2022
Here we present a methodology for identifying and characterizing nanoscale sites in EUV photoresists which deviate from the mean composition by 3σ. The methodology is based on Nano-Projectile Secondary Ion Mass Spectrometry (SIMS) operating in the in the
M. Eller, Jander Cruz, Stanislav V. Verkhorurov, M. A. Robinson, J. Blackwell, E. Schweikert   +5 more
semanticscholar   +2 more sources

Emerging machine learning strategies for diminishing measurement uncertainty in SPM nanometrology

Surface Topography Metrology and Properties, 2022
Scanning probe microscopy (SPM) is an outstanding nanometrology tool for characterizing the structural, electrical, thermal, and mechanical properties of materials at the nanoscale. However, many challenges remain in the use of SPM.
Linh Thi Thao Nguyen, Bernard Haochih Liu   +1 more
semanticscholar   +1 more source

Metrology and nanometrology at agricultur-al/food/nutraceutical interface: an updated shot

Current Bioactive Compounds, 2022
Nanometrology has been considered as a key to the future of nanotechnology since recently. It is particularly important for nanoparticle market development that is commonly applied in dif-ferent areas of science.
A. Zielińska, B. Santos, M. Silva, C. Fernandes, A. R. Silva, A. Durazzo, M. Lucarini, P. Eder, A. Santini, E. Souto   +9 more
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Nanoprojectile Secondary Ion Mass Spectrometry for Nanometrology of Nanoparticles and Their Interfaces.

Analytical Chemistry, 2022
Nanoscale molecular characterization plays a crucial role in enhancing our insights into fundamental and materials processes occurring at the nanoscale.
M. Eller, Jesse M. Sandoval, S. Verkhoturov, E. Schweikert   +3 more
semanticscholar   +1 more source

Contributions of Capillary Electrophoresis in Analytical Nanometrology: A Critical View

Critical reviews in analytical chemistry, 2021
An overview on the increasing role of capillary electrophoresis in characterization and direct analysis of nanomaterials is herein presented. The niche of electrophoretic approaches in nanometrology is so relevant that nonmetallic, metal, metal oxide ...
Carlos Adelantado, M. Zougagh, Á. Ríos
semanticscholar   +1 more source