Results 211 to 220 of about 4,739 (252)
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Nanometrology: particle sizing and influence on the toxicological profile

Frontiers in Nanotechnology
The in vitro and in vivo performance of nanoparticles is directly linked to their physicochemical attributes, i.e., their shape, size, crystal phase and surface properties.
W. S. Mota   +7 more
semanticscholar   +1 more source

Developing Nanometrology and non-destructive testing methods to ensure medical device manufacturing accuracy and safety

Gulf Journal of Advance Business Research
Ensuring the accuracy and safety of medical devices is paramount to guaranteeing their effectiveness in clinical applications. The integration of nanometrology and non-destructive testing (NDT) techniques has emerged as a critical approach for enhancing ...
Thompson Odion Igunma   +2 more
semanticscholar   +1 more source

Measuring the Future – Nanometrology for Advanced Manufacturing of Miniaturized Devices

Advanced Functional Materials
Nanometrology is a cornerstone of modern manufacturing and pivotal in enabling precise measurements as well as materials characterization at the micro‐ and nano‐scale.
Madhurya Chandel   +4 more
semanticscholar   +1 more source

Computational methods in nanometrology: the challenges of resolution and stochasticity

Frontiers in Nanotechnology
Nanometrology is vital for the advancement of nanotechnology but faces significant computational demands due to the complexity of measurements at the nanoscale.
A. Kondi   +3 more
semanticscholar   +1 more source

Nanometrological micromachined artefacts

Journal of Micromechanics and Microengineering, 1992
The fabrication of some unique artefacts with critical dimensions from deep submicron to several microns is described. These have been fabricated in silicon, in phosphosilicate glass (PSG) and in polysilicon films. The thermal reflow properties of PSG have been used to obtain artefacts with smooth spherical and cylindrical surfaces and the phosphorus ...
Ensell, G.   +4 more
openaire   +1 more source

Comparing bottom–up and top–down SI traceability approaches in dimensional nanometrology: reference material measurements using transmission electron microscopy and atomic force microscopy

Measurement science and technology
The lattice spacing of Si has recently been established as the mise en pratique (MeP) of the SI definition of the metre. These developments may influence the dimensional nanometrology, particularly when implemented in the measurements of semiconductor ...
R. Kizu, Keita Kobayashi
semanticscholar   +1 more source

High-precision tip-based nanofabrication and nanometrology in extended macroscopic working areas

Advanced Lithography
This paper introduces the Nano Fabrication Machine (NFM-100), a state-of-the-art system with a working range of up to 100mm in diameter, equipped with an integrated tip-based system, which serves both as an atomic force microscope (AFM) and as a tool for
J. Stauffenberg
semanticscholar   +1 more source

Nanometrology assisted chemical fabrication: direct laser writing of porphyrins onto complex surfaces.

Nanoscale
The association of operando monitoring methodologies with micro and nanoscale surface modification strategies has recently been shown to enable the preparation of complex yet highly precise organic functional surfaces.
Baptiste Maillot   +7 more
semanticscholar   +1 more source

Etalon for Nanometrology Produced by Anisotropic Etching

Nano- i Mikrosistemnaya Tehnika, 2021
Possibilities and results of using relief structures produced by anisotropic etching as etalons for linear measurements in nanorange are discussed. Two types of the structures with different profiles and with two approaches to estimation of influence of ...
Y. Larionov
semanticscholar   +1 more source

Plasmonic Lens for Nanometrology

Key Engineering Materials, 2010
In this paper, we presented plasmonic lens using metallic nanostructures to manipulate light based on surface plasmon polaritons for subwavelength focusing and collimation. We then proposed the use of plasmonic lens in the field of nanophotonics as a micro-photonic-device for nanometrology and sensing/detection purposes.
Jun Wang, Wei Zhou
openaire   +1 more source

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