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Thermoreflectance Detection of Point Defects Resulting from Focused Ion Beam Milling

open access: yesAdvanced Engineering Materials, EarlyView.
Focused ion beam (FIB) milling is a common tool for nanoscale material processing, however irradiation damage, redeposition, and contamination can occur. We use several characterization tools to show FIB‐induced effects beyond 1 mm from the milled area.
Thomas W. Pfeifer   +3 more
wiley   +1 more source

Proton-activated chloride channel PACC1 as acid sensor in epidermal desquamation. [PDF]

open access: yesProc Natl Acad Sci U S A
Xia K   +15 more
europepmc   +1 more source

Impact of plant fiber reinforcement on mechanical properties of PMMA denture base resin: a systematic review. [PDF]

open access: yesBiomater Investig Dent
Hammad Uddin MK   +9 more
europepmc   +1 more source
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