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Near-Field Scanning Optical Microscopy
Proceedings, annual meeting, Electron Microscopy Society of America, 1986The spatial resolution of most of the imaging or microcharacterization methods presently in use are fundamentally limited by the wavelength of the exciting or the emitted radiation being used. In general, the smaller the wavelength of the exciting probe, the greater the structural damage to the sample under study.
E. Betzig +3 more
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Towards terahertz near-field microscopy
Philosophical Transactions of the Royal Society of London. Series A: Mathematical, Physical and Engineering Sciences, 2003We have detected sub-wavelength spot sizes in the near-field of a metal tip, which is illuminated with terahertz (THz) pulses. The THz near-field is detected by using electro-optic detection in a (100) oriented GaP crystal. Contrary to conventional electro-optic detection, which uses (110) oriented detection crystals, (100) crystals only allow the ...
N C J, van der Valk, P C M, Planken
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Near field microscopy and near field optics
Reports on Progress in Physics, 1994The early eighties have experienced a revolution in the perception of physical phenomena. This revolution is the birth of a new generation of imaging systems based on the detection of non-radiating fields. The near field optical microscope is the latest of this family.
D Courjon, C Bainier
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Differential Near-Field Scanning Optical Microscopy
Nano Letters, 2006We theoretically and experimentally illustrate a new apertured near-field scanning optical microscopy (NSOM) technique, termed differential NSOM (DNSOM). It involves scanning a relatively large (e.g., 0.3-2 mum wide) rectangular aperture (or a detector) in the near-field of an object and recording detected power as a function of the scanning position ...
Aydogan, Ozcan +6 more
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Journal of Russian Laser Research, 2006
Three techniques of optical near-field microscopy are considered. In one of them a probe in the form of a nanosphere interacts with a solid surface. The second technique is a probeless one based on the Brewster reflection of a laser beam from the surface of a non-absorptive dielectric in the presence of foreign atoms at it. The third technique is based
O. N. Gadomsky +2 more
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Three techniques of optical near-field microscopy are considered. In one of them a probe in the form of a nanosphere interacts with a solid surface. The second technique is a probeless one based on the Brewster reflection of a laser beam from the surface of a non-absorptive dielectric in the presence of foreign atoms at it. The third technique is based
O. N. Gadomsky +2 more
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Scanning near-field microscopies
SPIE Proceedings, 1990Optical images whose resolution is not limited by diffraction can be created by recording the radiation from a point-like (subwavelength size) probe light source while raster scanning it across an object in immediate proximity. An imaging capability with resolution in the range from 1 to 50 nm has been demonstrated with various types of light sources ...
Dieter W. Pohl, James K. Gimzewski
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Scanning near-field optical microscopy
Current Opinion in Colloid & Interface Science, 1999Abstract Scanning near-field optical microscopy (SNOM) has become a widespread technique due to its promising ability of imaging with sub-micron resolution. Despite being developed over more than one decade, SNOM is still not a mature technique, which can be seen from the large number of recent publications describing instrumentational innovations ...
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AIP Conference Proceedings, 1991
Super resolution optical microscopy in the near field will be discussed. A brief survey of the principles of the method of near field scanning optical microscopy will be presented along with selected results and demonstrations that resolutions an order of magnitude smaller than the wavelength can be achieved.
M. Isaacson, J. Cline, H. Barshatzky
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Super resolution optical microscopy in the near field will be discussed. A brief survey of the principles of the method of near field scanning optical microscopy will be presented along with selected results and demonstrations that resolutions an order of magnitude smaller than the wavelength can be achieved.
M. Isaacson, J. Cline, H. Barshatzky
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Passive dual-probe near-field microscopy
Review of Scientific Instruments, 2022Accurate and simultaneous multiposition near-field measurements are essential to study the time-dependent local dynamics, including heat and carrier transfer. The existing passive long-wavelength infrared (LWIR) scattering-type scanning near-field optical microscopy (s-SNOM) systems with a single probe cannot perform precise near-field measurements of ...
R. Sakuma +4 more
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Terahertz near-field microscopy
Optical Terahertz Science and Technology, 2005We present results on the spatial extent and origin of the near-field of a metal tip and the first measurement on a crystal of CsI using THz apertureless scanning near-field optical microscopy.
P.C.M. Planken +2 more
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