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Terahertz Near-Field Microscopy
2008We report on apertureless terahertz (THz) microscopy and its application for semiconductor characterization. Extreme subwavelength resolutions down to 150nm are achieved with few-cycle THz pulses having a bandwidth of 3THz. The imaging mechanism is characterize by time-resolved THz techniques.
Roland Kersting +3 more
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Terahertz near-field microscopy
SPIE Proceedings, 2004We report on the development of an apertureless scanning near-field optical microscope for characterization of dielectric properties of nano-structures at terahertz frequencies. A spatial resolution of ≈ 150 nm is achieved, which corresponds to a sub-wavelength factor of ≈1/1000.
Hou-Tong Chen +2 more
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2018
In the following, some of the basic considerations at the foundation of near field microscopy are presented [1, 2, 3, 4, 5]. Near field microscopy is a new form of microscopy which was first proposed in 1928 as a means of increasing microscope resolution over that available by traditional techniques of far field microscopes.
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In the following, some of the basic considerations at the foundation of near field microscopy are presented [1, 2, 3, 4, 5]. Near field microscopy is a new form of microscopy which was first proposed in 1928 as a means of increasing microscope resolution over that available by traditional techniques of far field microscopes.
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Scanning Near Field Optical Microscopy
1992This article reviews Scanning Near Field Optical Microscopy focusing on the different types of antennas which have been employed as sensors. A proposal for a coaxial tip as a new type of sensor is made in conjunction with a way of its fabrication.
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Graphene-Enhanced Infrared Near-Field Microscopy
Nano Letters, 2014Graphene is a promising two-dimensional platform for widespread nanophotonic applications. Recent theories have predicted that graphene can also enhance evanescent fields for subdiffraction-limited imaging. Here, for the first time we experimentally demonstrate that monolayer graphene offers a 7-fold enhancement of evanescent information, improving ...
Peining, Li +3 more
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Long-Wave-Infrared Near-Field Microscopy
physica status solidi (b), 1999MPIBIO: ASCA-Processing week 38/99; copyright ...
Keilmann, F., Knoll, B., Kramer, A.
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Scanning Near-Field Optical Microscopy/Near-Field Scanning Optical Microscopy
2018Scanning near-field optical microscopy (SNOM)/near-field scanning optical microscopy (NSOM) is one of the scanning probe microscopies, especially for investigation of optical properties and phenomena in nanometer scale. SNOM/NSOM observation provides high spatial resolution of 10–100 nm that conventional optical microscopes do not achieve, in principle.
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Conference on Lasers and Electro-Optics Europe, 1996
Near field microscopy is about ten years old. Unlike Scanning Tunneling Microscopy, its progress has been slow and somewhat erratic. Today, we can consider that this new tool is mature enough to be used in a few routine surface characterization procedures.
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Near field microscopy is about ten years old. Unlike Scanning Tunneling Microscopy, its progress has been slow and somewhat erratic. Today, we can consider that this new tool is mature enough to be used in a few routine surface characterization procedures.
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12th International Conference on Optical Fiber Sensors, 1997
Shear force distance control can be carried out using an auxiliary laser, but I will describe the use of a tuning fork technique in which interaction between tip and sample stiffens the fork and shifts its resonance frequency. We have shown that the damping of tip vibration that occurs in these distance control techniques is primarily due to the tip ...
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Shear force distance control can be carried out using an auxiliary laser, but I will describe the use of a tuning fork technique in which interaction between tip and sample stiffens the fork and shifts its resonance frequency. We have shown that the damping of tip vibration that occurs in these distance control techniques is primarily due to the tip ...
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Near-field fluorescence microscopy of cells
Ultramicroscopy, 1998We demonstrate the surface sensitivity of near-field scanning optical microscopy by fluorescence imaging of membrane and bulk proteins in cells. We discuss instrument design considerations for successful cell-biology work with NSOM and show that the technique is most suited for studying membrane proteins.
T, Enderle, T, Ha, D S, Chemla, S, Weiss
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