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Oyo Buturi, 1975 Some of the next articles are maybe not open access.
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2016
Max Planck used to say that the only things that exist are those that can be measured. In this chapter a general vision of the issues faced while performing measurements of nanomechanical resonators is presented. Different noise sources are analyzed: thermomechanical noise, electrical noise (Johnson, 1∕f, shot noise), and amplifier noise; to later ...
Silvan Schmid +2 more
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Max Planck used to say that the only things that exist are those that can be measured. In this chapter a general vision of the issues faced while performing measurements of nanomechanical resonators is presented. Different noise sources are analyzed: thermomechanical noise, electrical noise (Johnson, 1∕f, shot noise), and amplifier noise; to later ...
Silvan Schmid +2 more
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Applied Optics, 1973
The effect of shot noise on the MTF of a lens when measured by means of an edge scan is treated both analytically and experimentally. It is shown that the variance in the MTF, introduced by the shot noise, establishes an upper bound on the magnitude of any systematic error introduced into the MTF measurement by the noise.
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The effect of shot noise on the MTF of a lens when measured by means of an edge scan is treated both analytically and experimentally. It is shown that the variance in the MTF, introduced by the shot noise, establishes an upper bound on the magnitude of any systematic error introduced into the MTF measurement by the noise.
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2014
In frequency domain measurements, electronic noise shows up in two distinctly different ways. The first case is when the measurement is affected by the presence of unwanted noise, with noise being a nuisance. For example, we could be measuring the distortion of an amplifier with the amplifier's noise degrading the measurement.
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In frequency domain measurements, electronic noise shows up in two distinctly different ways. The first case is when the measurement is affected by the presence of unwanted noise, with noise being a nuisance. For example, we could be measuring the distortion of an amplifier with the amplifier's noise degrading the measurement.
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2006
The following topics will be considered: Noise characterisation of voltage amplifiers in series. Noise measuring set-up with dc excitation and single ended ac-amplifier or differential amplifier in a bridge configuration. Bias and sample criteria to observe 1/f noise in homogeneous samples submitted to homogeneous fields. Criteria for highest S V value
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The following topics will be considered: Noise characterisation of voltage amplifiers in series. Noise measuring set-up with dc excitation and single ended ac-amplifier or differential amplifier in a bridge configuration. Bias and sample criteria to observe 1/f noise in homogeneous samples submitted to homogeneous fields. Criteria for highest S V value
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Noise and the measurement of noise quantities
1996Sensitivity and noise factor are the conventional parameters which describe the, capability of a system to process weak signals. The noise factor is particularly important, since it characterises not only the system as a whole but also its modules (such as HF preamplifiers, mixers, or IF amplifiers).
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2023
Abstract Chapter 4 examines various attempts engineers and technologists made to turn noise into measurable quantities in the 1910s–30s. Two approaches characterized these attempts. One was to gauge the subjective loudness of noise through an ear-balancing method that compared the measurable with an adjustable reference sound.
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Abstract Chapter 4 examines various attempts engineers and technologists made to turn noise into measurable quantities in the 1910s–30s. Two approaches characterized these attempts. One was to gauge the subjective loudness of noise through an ear-balancing method that compared the measurable with an adjustable reference sound.
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Measurement Amps, Noise Generators and FFT Noise Measurements
2011In 1989 M. Wilfried Adam published a great article on the design of low-noise audio amps. The complete circuitry of a noise measurement system (MS) also became part of that article. M. Adam described all necessary measurement filters too. Instead of buying a very expensive all-in-one measurement instrument a few months later I decided to develop my own
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The noise dosimeter for measuring personal noise exposure
Acta Oto-Laryngologica, 1970A pilot study of personal noise exposure measurements with the use of noise dosimeters is presented. The value of objective individual recordings regarding the intensity and the exposure time is emphasized. Unexpected daily variations were detected also among employees assumed to work in fixed noise—level environments.
S, Lagerholm, N G, Toremalm
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IEEE Transactions on Geoscience Electronics, 1970
Environmental noise is widely noted as a form of "pollution." Measurement of noise intensity as a function of frequency is essential to its understanding and control. This is a tutorial paper summarizing standard current techniques and precautions to be followed in measuring environmental noise.
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Environmental noise is widely noted as a form of "pollution." Measurement of noise intensity as a function of frequency is essential to its understanding and control. This is a tutorial paper summarizing standard current techniques and precautions to be followed in measuring environmental noise.
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