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Simplified noise model parameter estimation for signal-dependent noise
Signal Processing, 2014In this paper, we present a noise parameter estimation method using a simplified signal-dependent noise model. The generic Poisson-Gaussian noise model is simplified to a Gaussian-Gaussian noise model. From the simplified noise model, we experimentally verify that the value obtained by the robust median estimator is almost the same as the mean of the ...
Bo Gyu Jeong +3 more
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Hearing parameters in noise exposed industrial workers
Auris Nasus Larynx, 1998This paper presents the results of a study carried out in a group of noise-exposed workers in a hydro-electric power plant. Thus, the main focus of the study is on 130 industrial workers who were exposed to high level of noise. The control group was consisted of 33 subjects with normal hearing.
O, Celik, S, Yalçin, A, Oztürk
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Noise parameters of photodetector arrays
Journal of Optical Technology, 2012This paper discusses features of the various parameters of photodetector arrays (PDAs) that characterize their noise properties. It is pointed out that the overall sensitivity, expressed as the number of electrons per second per lumen, and the intensity of the internal noise electrons, expressed as the number of electrons per second from unit area and ...
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Noise parameters of SIS mixers
IEEE Transactions on Microwave Theory and Techniques, 1988It has been shown that low-noise receivers can be constructed at millimeter wavelengths by using mixers containing superconducting tunnel junctions as the nonlinear elements. This is possible because of both the low intrinsic noise of these devices and their potential for high conversion gain.
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Analysis of noise parameters extraction from noise figure measurements
Proceedings of the 39th Midwest Symposium on Circuits and Systems, 2002Noise characterization of active devices continues to be an area of increasing significance in the rapidly expanding field of RF wireless communications. The accuracy of noise parameter estimation is a challenging task, limited by the uncertainties in the noise (noise source and noise figure) measurements, the errors in the source admittance ...
J. Sanderson, B.P. Kumar, G.R. Branner
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Extraction of VLF-noise parameters
MILCOM 92 Conference Record, 2003An algorithm is developed for real-time extraction of the parameters (power, impulsivity, and spikiness) of the Field-Lewinstein model for very-low-frequency (VLF) noise. This algorithm operates upon the first three moments of the noise envelope, which can be obtained by simple signal-processing hardware or software.
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Thermal Noise in MOSFETs: A Two- or a Three-Parameter Noise Model?
IEEE Transactions on Electron Devices, 2010In this brief, it is clearly demonstrated that a two-parameter noise model is sufficient to accurately extract the MOSFET high-frequency noise performance, as long as channel uniformity is ensured (which corresponds to mainstream CMOS technology). Nevertheless, in the case of asymmetric channel-based MOSFETs, it is shown that a three-parameter noise ...
Emam, M. +5 more
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HEMT models for S-parameter and noise parameter extrapolation
1992 IEEE Microwave Symposium Digest MTT-S, 2003Four models have been developed and assessed for fitting the measured noise parameters up to 26 GHz and S-parameters up to 400 GHz for a commercial HEMT (high electron mobility transistor) chip. The first treats the intrinsic noise sources as uncorrelated thermal sources.
M.T. Hickson, P. Gardner, D.K. Paul
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Multi-port noise parameter determination
2016 Texas Symposium on Wireless and Microwave Circuits and Systems (WMCS), 2016The paper outlines the main results of a novel and comprehensive analysis for the determination of the noise parameters of linear noisy microwave networks with any number of ports. The well-established approach by Lane for the case of linear 2 port networks becomes a particular case of this analysis.
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Novel Noise Parameter Determination for On-Wafer Microwave Noise Measurements
IEEE Transactions on Instrumentation and Measurement, 2008A novel method to determine the noise parameters of receivers or devices under test (DUTs) for on-wafer microwave noise measurements is presented. An iterative technique is utilized, and fast convergence is achieved by the proposed impedance selection principle. This proposed method reduces the parameter variations in the conventional methods.
null Chih-Hung Chen +3 more
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