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Noise Parameter Estimation from Quantized Data
Proceedings of the 2006 IEEE International Workshop on Advanced Methods for Uncertainty Estimation in Measurement (AMUEM 2006), 2006In this paper, the parametric estimation of the variance of white Gaussian noise is considered when available data are obtained from a quantized noisy stimulus. The Crameacuter-Rao lower bound is derived, and the statistical efficiency of a maximum-likelihood parametric estimator is discussed, along with the estimation algorithm proposed in IEEE ...
MOSCHITTA, Antonio, CARBONE, Paolo
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On the determination of noise parameters of low‐noise transistor devices
International Journal of Numerical Modelling: Electronic Networks, Devices and Fields, 2015AbstractIn this paper, we discuss the experimental determination of noise parameters for high‐electron‐mobility transistor (HEMT) devices and analyze the problems encountered with conventional extraction techniques. HEMT devices are distinguished by a very small minimum noise figure of only a fraction of a dB, and this minimum noise is accomplished ...
M. Seelmann‐Eggebert +7 more
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Parameter estimation of a decaying exponential in noise
2009 16th International Conference on Digital Signal Processing, 2009The estimation of the parameters of a decaying complex exponential in noise was examined by Bertocco et al. who developed a frequency domain interpolator using two DFT coefficients around the maximum bin. Quinn, on the other hand, and more recently Aboutanios and Mulgrew (A&M), proposed similar frequency estimators for the undamped case. In this paper,
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FET noise model and on-wafer measurement of noise parameters
1991 IEEE MTT-S International Microwave Symposium Digest, 1991A noise model of a microwave FET (M.W. Pospieszalski 1988, 1989) is verified with on-wafer S-parameters and noise parameter measurement data. An excellent agreement between the model prediction and measurement results is obtained for a wide range of FET bias.
M.W. Pospieszalski, A.C. Niedzwiecki
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Verification of the Noise Parameter Instrumentation
49th ARFTG Conference Digest, 1997The available gain of a linear two-port device, as a function of a source reflection coefficient, can be characterized by measuring its scattering parameters on a Vector Network Analyzer(VNA). An alternate characterization procedure of the available gain, as a function of a source reflection coefficient, using a noise source and noise figure receiver ...
Vahe' Adamian, Randy Fenton
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Stabilization of the Barkhausen Noise Parameters
IEEE Transactions on Magnetics, 2010The Barkhausen noise was measured in nonoriented Fe-3%Si steel with different average grain sizes. Air gaps between the yoke and the measured objects were also varied during the measurements. The change of the grain size was achieved by different combinations of cold rolling and heat treatment processes.
Jozef Pal'a +3 more
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Middleton’s Class A Noise Parameter Estimator
IEEE Embedded Systems Letters, 2023Lucas A. Rabioglio +3 more
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Generalized Determination of Device Noise Parameters
IEEE transactions on microwave theory and techniques, 2017L. Boglione
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Antenna Two-Port Electrical and Noise Parameters
IEEE Antennas and Wireless Propagation Letters, 2017Patricia Groves +3 more
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