Results 281 to 290 of about 608,210 (316)

Joint Identification of System Parameter and Noise Parameters  in Quantized Systems

Systems & Control Letters
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Jieming Ke, Yanlong Zhao, Ji-Feng Zhang
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Verification of the Noise Parameter Instrumentation

49th ARFTG Conference Digest, 1997
The available gain of a linear two-port device, as a function of a source reflection coefficient, can be characterized by measuring its scattering parameters on a Vector Network Analyzer(VNA). An alternate characterization procedure of the available gain, as a function of a source reflection coefficient, using a noise source and noise figure receiver ...
Vahe' Adamian, Randy Fenton
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FET noise model and on-wafer measurement of noise parameters

1991 IEEE MTT-S International Microwave Symposium Digest, 1991
A noise model of a microwave FET (M.W. Pospieszalski 1988, 1989) is verified with on-wafer S-parameters and noise parameter measurement data. An excellent agreement between the model prediction and measurement results is obtained for a wide range of FET bias.
M.W. Pospieszalski, A.C. Niedzwiecki
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Stabilization of the Barkhausen Noise Parameters

IEEE Transactions on Magnetics, 2010
The Barkhausen noise was measured in nonoriented Fe-3%Si steel with different average grain sizes. Air gaps between the yoke and the measured objects were also varied during the measurements. The change of the grain size was achieved by different combinations of cold rolling and heat treatment processes.
Jozef Pal'a, Jan Bydzovsky, Volodymyr Stoyka, Frantisek Kovac   +3 more
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Noise parameters of photodetector arrays

Journal of Optical Technology, 2012
This paper discusses features of the various parameters of photodetector arrays (PDAs) that characterize their noise properties. It is pointed out that the overall sensitivity, expressed as the number of electrons per second per lumen, and the intensity of the internal noise electrons, expressed as the number of electrons per second from unit area and ...
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Middleton’s Class A Noise Parameter Estimator

IEEE Embedded Systems Letters, 2023
Lucas A. Rabioglio, María C. Cebedio, Jorge Castiñeira Moreira, Leonardo J. Arnone   +3 more
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Extraction of VLF-noise parameters

MILCOM 92 Conference Record, 2003
An algorithm is developed for real-time extraction of the parameters (power, impulsivity, and spikiness) of the Field-Lewinstein model for very-low-frequency (VLF) noise. This algorithm operates upon the first three moments of the noise envelope, which can be obtained by simple signal-processing hardware or software.
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Determination of Noise Parameters

Workshop on Measurement Techniques for Microwave Device Characterization and Modelling, 2005
G. Dambrine, A. Cappy, Y. Guillerme
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Noise parameters of SIS mixers

IEEE Transactions on Microwave Theory and Techniques, 1988
It has been shown that low-noise receivers can be constructed at millimeter wavelengths by using mixers containing superconducting tunnel junctions as the nonlinear elements. This is possible because of both the low intrinsic noise of these devices and their potential for high conversion gain.
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Fifty Years of Noise Modeling and Mitigation in Power-Line Communications

IEEE Communications Surveys and Tutorials, 2021
Tong Bai, Hongming Zhang, Jingjing Wang   +2 more
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