Electron trapping effect on the switching behavior of contact RRAM devices through random telegraph noise analysis
A model for 1/f noise in diffusion current based on surface recombination velocity fluctuations and insulator trapping
Reduction of optical field noise by differential detection in atomic clocks based on coherent population trapping
Low Frequency Drain Noise Characterization of Different Technologies of GaN HEMTs:Investigation of Trapping Mechanism
Electrical flicker-noise analysis based on trapping and de-trapping model in quantum-cascade detectors
Evidence for 1/f noise in diffusion current due to insulator trapping and surface recombination velocity fluctuations
