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Non-contact lateral force microscopy
Journal of Physics: Condensed Matter, 2017The goal of atomic force microscopy (AFM) is to measure the short-range forces that act between the tip and the surface. The signal recorded, however, includes long-range forces that are often an unwanted background. Lateral force microscopy (LFM) is a branch of AFM in which a component of force perpendicular to the surface normal is measured.
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Non-contact acoustic microscopy
Measurement Science and Technology, 2000We demonstrate a fast all-optical surface acoustic wave (SAW) microscope. This acoustic microscope may be thought of as a non-contact (hence non-perturbing) surface acoustic microscope. The key to producing a sufficiently high SAW amplitude for imaging without producing surface damage is to tailor the generating optical distribution.
Matt Clark, Steve Sharples, Mike Somekh
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Non-contact vibration sensor using deep learning and image processing
, 2021Jinquan Guo +7 more
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3D Printed Electronics of Non-contact Ink Writing Techniques: Status and Promise
International Journal of Precision Engineering and Manufacturing - Green Technology, 2020Haining Zhang, S. K. Moon, Teck Hui Ngo
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Non-contact current measurements
The monograph is devoted to the actual and practically important scientific and technical problem of non-contact diagnostic examinations of underground (and underwater) pipelines (UP) and other current-carrying communications. The results of theoretical and experimental studies and scientific and technical approaches to the development of new methods ...openaire +1 more source
Support vector machines based non-contact fault diagnosis system for bearings
Journal of Intelligent Manufacturing, 2019D. Goyal +3 more
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