Results 1 to 10 of about 38,344 (233)

Real-time Optical Dimensional Metrology via Diffractometry for Nanofabrication. [PDF]

Sci Rep, 2020
AbstractSurface patterning technologies represent a worldwide growing industry, creating smart surfaces and micro/nanoscale device. The advent of large-area, high-speed imprinting technologies has created an ever-growing need for rapid and non-destructive dimensional metrology techniques to keep pace with the speed of production.
Whitworth GL, Francone A, Sotomayor-Torres CM, Kehagias N.   +3 more
europepmc   +9 more sources

Non-contact optical three dimensional liner metrology [PDF]

IEEE Conference Record - Abstracts. PPPS-2001 Pulsed Power Plasma Science 2001. 28th IEEE International Conference on Plasma Science and 13th IEEE International Pulsed Power Conference (Cat. No.01CH37255), 2002
Summary form only given, as follows. We optically captured the "as-built" geometry of NTLX cylindrical liners for Shiva Star using an ultra-precision ranging laser. We subsequently verified the resulting digitized geometry against the 3D CAD model of the part.
R.J. Sebring, J.M. Edwards, M.A. Salazar
openaire   +2 more sources

Optical measurement techniques for mobile and large-scale dimensional metrology [PDF]

Optics and Lasers in Engineering, 2009
Abstract Dimensional inspection tasks are often carried out on conventional coordinate measuring machines (CMMs). These CMMs can differ in layout and size depending on the application area. They can have measurement volumes up to 100 m3. However, when measuring large objects it is not always possible to bring a large object to these conventional CMMs.
W. Cuypers, N. Van Gestel, A. Voet, J.-P. Kruth, J. Mingneau, P. Bleys   +5 more
openaire   +2 more sources

Review of the mathematical foundations of data fusion techniques in surface metrology [PDF]

, 2015
The recent proliferation of engineered surfaces, including freeform and structured surfaces, is challenging current metrology techniques. Measurement using multiple sensors has been proposed to achieve enhanced benefits, mainly in terms of spatial ...
Ai C, Barker R M, Boudjemaa R, De Boor C, D𝚤ez D C, Fabio R, GmbH W, Golub G H, Hansen C D, Hao C, Hemsley R, Inhull, ISO 25178-6, ISO 25178-604, ISO/DIS 25178-606, JDL, Jiang X, Kjer H M, Leica Microsystems, Low K-L, Mathworks, Raid I, Ramasamy S K, Rasmussen C E, Rasmussen C E, Schabenberger O, Schmit J, Seeger S, Shekhar S, Strutz T, Sun W, Wang J, Weisstein E W, Yamany S M, Yan-Mei C   +34 more
core   +1 more source

Reconstruction of freeform surfaces for metrology [PDF]

, 2013
The application of freeform surfaces has increased since their complex shapes closely express a product's functional specifications and their machining is obtained with higher accuracy.
ANWER, Nabil, DAMAK, Mohamed, EL HAYEK, Nadim, GIBARU, Olivier, NOUIRA, Hichem   +4 more
core   +5 more sources

Transfer of autocollimator calibration for use with scanning gantry profilometers for accurate determination of surface slope and curvature of state of the art x ray mirrors [PDF]

, 2019
X ray optics, desired for beamlines at free electron laser and diffraction limited storage ring x ray light sources, must have almost perfect surfaces, capable of delivering light to experiments without significant degradation of brightness and coherence.
Anderson, K., Dickert, J., Geckeler, R., Just, A., Lacey, I., Siewert, F., Smith, B., Yashchuk, V.   +7 more
core   +2 more sources

Concept and architecture of a new apparatus for cylindrical form measurement with a nanometric level of accuracy [PDF]

, 2012
In relation to the industrial need and to the progress of technology, Laboratoire National de M´etrologie et d’Essais (LNE) would like to improve the measurement of its primary pressure standards, spherical and flick standards.
DAMAK, Mohamed, DAVID, Jean-Marie, GIBARU, Olivier, NOUIRA, Hichem, VISSIERE, Alain   +4 more
core   +6 more sources

MScMS-II: an innovative IR-based indoor coordinate measuring system for large-scale metrology applications [PDF]

, 2010
According to the current great interest concerning large-scale metrology applications in many different fields of manufacturing industry, technologies and techniques for dimensional measurement have recently shown a substantial improvement.
Barbara Pralio, D Maisano, EM Mikhail, F Franceschini, F Franceschini, F Franceschini, GN Peggs, HC Longuet-Higgins, Luca Mastrogiacomo, M Fischler, M Galetto, Maurizio Galetto, MJ Puttock, RI Hartley, RY Tsai, T Luhmann, T Svoboda, TH Hopp, W Cuypers, WT Estler, Z Zhang   +20 more
core   +1 more source

Heterodyne range imaging as an alternative to photogrammetry [PDF]

, 2007
Solid-state full-field range imaging technology, capable of determining the distance to objects in a scene simultaneously for every pixel in an image, has recently achieved sub-millimeter distance measurement precision.
Carnegie, Dale A., Conroy, Richard M., Cree, Michael J., Dorrington, Adrian A., Payne, Andrew D.   +4 more
core   +2 more sources

Implementation of in Process Surface Metrology for R2R Flexible PV Barrier Films [PDF]

, 2015
Thin functional barrier layers of aluminum oxide (Al2O3) that are used particularly in photovoltaic (PV) modules to prevent the possibility of water vapor ingress should be applied over the entire PV surface without any defects.
Blunt, Liam, Elrawemi, Mohamed, Fleming, Leigh, Gao, F., Muhamedsalih, Hussam   +4 more
core   +1 more source