Results 121 to 130 of about 38,344 (233)

Surface Inspection and Description in Metrology and Tribology-Vol. 2. [PDF]

Materials (Basel)
Wieczorowski M, Bigerelle M, Brown CA, Pawlus P, Reizer R, Pereira A.   +5 more
europepmc   +1 more source

Comparison of Deterministic and Probabilistic Machine Learning Algorithms for Precise Dimensional Control and Uncertainty Quantification in Additive Manufacturing

Engineering Reports, Volume 8, Issue 3, March 2026.
Implementation of deterministic and probabilistic regression algorithms on an additive manufacturing dataset for prediction of dimensional accuracy—difference from target (DFT), which is the dimensional deviation of a manufactured part from a reference computer‐aided design geometry.
Dipayan Sanpui, Anirban Chandra, Henry Chan, Sukriti Manna, Subramanian K. R. S. Sankaranarayanan   +4 more
wiley   +1 more source

Deep learning and superoscillatory speckles empowered multimode fiber probe for in situ nano-displacement detection and micro-imaging. [PDF]

Nat Commun
Wang L, Zhang Y, Zhou Y, Meng Y, Lu Z, Li P, Zhang H, Li D, Yan P, Xiao Q, Liu Q.   +10 more
europepmc   +1 more source

Measurement of Lateral Resolution in Confocal Raman Spectroscopy Using Indium Arsenide Nanowires

Journal of Raman Spectroscopy, Volume 57, Issue 3, Page 448-458, March 2026.
Lateral resolution is a key performance parameter for confocal Raman spectroscopy. We propose a protocol using an indium arsenide nanowire reference sample to quantitatively measure the resolution. The suitability of the method has been demonstrated through an international comparison with 15 participants. ABSTRACT Lateral resolution is a key figure of
Sebastian Wood, Keith R. Paton, Ruth Rawcliffe, Tomas Peach, Tehseen Adel, Alessio Sacco, Hugo Kerdoncuff, Matthieu Paillet, Ahmed‐Azmi Zahab, Paul Finnie, Li‐Lin Tay, Jeongyong Kim, Hyuksang Kwon, Nobuyasu Itoh, Shinsuke Kashiwagi, Andrea Mario Rossi, Yaxuan Yao, Lingling Ren, Elif Ozçeri, Gemma Rius, David Steinmetz, Andrea Richter, Thomas Dieing, Agnès Tempez, Ophelie Lancry, Marc Chaigneau, Angela R. Hight Walker, Erlon H. M. Ferreira, Maxim Shkunov, Fernando A. Castro   +29 more
wiley   +1 more source

Deep‐UV Photonic Crystal Surface‐Emitting Lasers

Laser &Photonics Reviews, Volume 20, Issue 6, 18 March 2026.
The first deep‐UV photonic crystal surface‐emitting lasers (PCSELs) at 279 nm are demonstrated under pulsed optical pumping. The PCSELs have single‐mode emission with a 17‐pm linewidth and a divergence angle of less than 1∘$^{\circ }$. Experimental results highlight the impact of the filling factor choice on the lasing mode and the far‐field emission ...
Doğukan Apaydın, Hjalmar Andersson, Lukas Uhlig, Sarina Graupeter, Joachim Ciers, Giulia Cardinali, Erik Strandberg, Tim Wernicke, Michael Kneissl, Ulrich Theodor Schwarz, Philippe Tassin, Åsa Haglund   +11 more
wiley   +1 more source

Dimensional validation of CubeSat structures using 3D optical scanning technology. [PDF]

Sci Rep
Eulopa-Hernandez JF, Bibiano-Valente ES, Padilla-Pérez DA, Meléndez-Martínez J, Couder-Castañeda C, Grageda-Arellano JI.   +5 more
europepmc   +1 more source

Dispersion‐Less Dissipative Soliton Fiber Laser

Laser &Photonics Reviews, Volume 20, Issue 6, 18 March 2026.
A dispersion‐less fiber laser architecture generates high‐energy, pedestal‐free picosecond pulses without resorting to conventional pulse stretching. This energy‐managed laser achieves remarkable flexibility in pulse parameters, delivering up to 0.54 μJ$\mathrm{\mu}\mathrm{J}$ pulses with minimal spectral distortion using standard telecom components ...
Mostafa I. Mohamed, Aurélien Coillet, Philippe Grelu   +2 more
wiley   +1 more source

Precision Nanometrology: Laser Interferometer, Grating Interferometer and Time Grating Sensor. [PDF]

Sensors (Basel)
Cui C, Li X.
europepmc   +1 more source

Time‐Stretched Interferometric LiDAR with Dispersive Wavenumber‐to‐Time Range Encoding

Laser &Photonics Reviews, Volume 20, Issue 5, 6 March 2026.
We present a time‐stretched interferometric LiDAR that directly encodes distance into time‐domain interference signals. Operating at 5 MHz with only millimeter‐level coherence length, the system measures up to 12 m with centimeter precision and resolution, achieving high‐speed 3D imaging and dynamic target detection without FFT processing or long ...
Dahun Jung, Gyeong Hun Kim, Seongjin Bak, Jaeheung Kim, Sang Min Park, Wontae Choe, Chang‐Seok Kim, Hwidon Lee   +7 more
wiley   +1 more source

AI-Powered Next-Generation Technology for Semiconductor Optical Metrology: A Review. [PDF]

Micromachines (Basel)
Xu W, Zhang H, Ji L, Li Z.
europepmc   +1 more source